Picometer-precision few-tilt ptychotomography of 2D materials

Number of the records: 1

Title	Picometer-precision few-tilt ptychotomography of 2D materials
Author	Hofer C.
Co-authors	Mustonen K.
	Skákalová Viera SAVELEK - Elektrotechnický ústav SAV
	Pennycook T.J.

Source document	. Vol. 10 (2023), no. 035029 2D Materials
Language	eng - English
Country	GB - Great Britian
Document kind	rozpis článkov z periodík (rbx)
Category	ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
Category of document (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Type of document	článok
Year	2023
Registered in	WOS
Registered in	SCOPUS
Registered in	CCC
DOI	10.1088/2053-1583/acdd80

article

	File name	Access	Size	Downloaded	Type	License
	Picometer-precision few-tilt ptychotomography of 2D materials.pdf	available	3 MB	0	Publisher's version

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
	A

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2023	2022	5.5	Q2	1.631	Q1

Number of the records: 1