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Determination of the conduction band offset in the a-Si:H/c-Si heterojunction structures from coplanar temperature current-voltage measurements

  1. TitleDetermination of the conduction band offset in the a-Si:H/c-Si heterojunction structures from coplanar temperature current-voltage measurements
    Author Mikolášek M.
    Co-authors Prušáková L.

    Matay Ladislav 1950- SAVINFO - Ústav informatiky SAV    SCOPUS    RID

    Řeháček V.

    Jakabovič J.

    Vanko Gabriel 1981 SAVELEK - Elektrotechnický ústav SAV    ORCID

    Kotlár M.

    Harmatha L.

    Source document / Pudiš D. ; Kubicova I. ; Bury P. APCOM 2011 : proceedings of the 17th International Conference on Applied Physics of Condensed Matter, held in SPA Nový Smokovec, High Tatras, Slovakia, June 22-24, 2011. P. 184-187. - Žilina : University of Žilina, 2011
    Languageeng - English
    Document kindrozpis článkov z periodík (rzb)
    CategoryAED - Scientific papers in domestic peer-reviewed proceedings, monographs
    Category of document (from 2022)V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka
    Type of documentpríspevok
    Year2011
    article

    article

    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    2011
Number of the records: 1  

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