Determination of residual stress in thin film by GIXRD

Number of the records: 1

Title	Determination of residual stress in thin film by GIXRD
Author	Novák P.
Co-authors	Dobročka Edmund 1955 SAVELEK - Elektrotechnický ústav SAV ^ORCID
	Búc D.
	Kováč Jaroslav

Source document	/ Vajda J. ; Jamnický I. Proceedings of the 20th International Conference on Applied Physics of Condensed Matter : APCOM 2014. P. 300-303. - Bratislava : FEI STU, 2014 ; International Conference on Applied Physics of Condensed Matter APCOM 2014
Language	slo - Slovak
Document kind	rozpis článkov z periodík (rzb)
Category	AFD - Published papers from domestic scientific conferences
Year	2014

article

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2014

Number of the records: 1