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Evaluation of SI GaAs detectors after radiation degradation via alpha spectrometry
Title Evaluation of SI GaAs detectors after radiation degradation via alpha spectrometry Author Šagátová A. Co-authors Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV ORCID Nečas V. Sedlačková K. Fulop M. Source document APCOM 2017 : proceedings of the 23th International Conference on Applied Physics of Condensed Matter, June 12-14, 2017, Štrbské Pleso, Slovak Republic. P. 119-122. - Bratislava : SPEKTRUM STU, 2017 / Vajda J. ; Jamnický I. Language eng - English Document kind rozpis článkov z periodík (rzb) Category AFD - Published papers from domestic scientific conferences Year 2017 
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rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2017
Number of the records: 1