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Characterization of monolithic InAlN/GaN NAND logic cell supported by device simulation
Title Characterization of monolithic InAlN/GaN NAND logic cell supported by device simulation Author Chvála A. Co-authors Nagy L. Marek J. Priesol J. Blaho Michal 1983 SAVELEK - Elektrotechnický ústav SAV Kuzmík Ján 1960 SAVELEK - Elektrotechnický ústav SAV ORCID Gregušová Dagmar 1958 SAVELEK - Elektrotechnický ústav SAV ORCID Príbytný P. Bernát M. Donoval D. Šatka A. Source document ADEPT 2017 : proceedings of the 5th International Conference on Advances in Electronic and Photonic Technologies, Podbanské, High Tatras, Slovakia, June 19-22, 2017. P. 40-43. - Žilina : University of Žilina, 2017 / Lettrichová I. ; Šušlik Ľ. ; Kováč Jaroslav Jr. Language eng - English Document kind rozpis článkov z periodík (rzb) Category AFD - Published papers from domestic scientific conferences Year 2017 DOI 10.1109/TED.2018.2828464 article
rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2017
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