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Analysis and modeling of vertical current conduction and breakdown mechanisms in semi-insulating GaN grown on GaN: role of deep levels

  1. TitleAnalysis and modeling of vertical current conduction and breakdown mechanisms in semi-insulating GaN grown on GaN: role of deep levels
    Author Stoklas Roman 1981 SAVELEK - Elektrotechnický ústav SAV    ORCID
    Co-authors Chvála A.

    Šichman Peter SAVELEK - Elektrotechnický ústav SAV

    Hasenöhrl Stanislav 1956 SAVELEK - Elektrotechnický ústav SAV    ORCID

    Haščík Štefan 1956 SAVELEK - Elektrotechnický ústav SAV

    Priesol J.

    Šatka A.

    Kuzmík Ján 1960 SAVELEK - Elektrotechnický ústav SAV    ORCID

    Source document IEEE Transactions on Electron Devices. Vol. 68 (2021), no. 2365
    Languageeng - English
    Document kindrozpis článkov z periodík (rbx)
    CitationsKIM, H. Vertical Schottky Contacts to Bulk GaN Single Crystals and Current Transport Mechanisms: A Review. In JOURNAL OF ELECTRONIC MATERIALS. ISSN 0361-5235, DEC 2021, vol. 50, no. 12, SI, p. 6688-6707.
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2021
    Registered inWOS
    Registered inSCOPUS
    Registered inCCC
    DOI 10.1109/TED.2021.3065893
    article

    article

    File nameAccessSizeDownloadedTypeLicense
    Analysis and Modeling of Vertical Current.pdfNeprístupný/archív1.3 MB1Publisher's version
    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    202120202.917Q20.828Q1
Number of the records: 1  

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