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Thin-layer magnetic resonance imaging based on magnetic susceptibility pattern projections
Title Thin-layer magnetic resonance imaging based on magnetic susceptibility pattern projections Author Frollo Ivan 1939 SAVMER - Ústav merania SAV SCOPUS RID Co-authors Andris Peter 1952 SAVMER - Ústav merania SAV SCOPUS RID ORCID Juráš Vladimír 1978 SAVMER - Ústav merania SAV ORCID Strolka Igor SAVMER - Ústav merania SAV Source document MEASUREMENT 2005 : 5th International Conference on Measurement. P. 501-505. - Bratislava : Institute of Measurement Science, SAS, 2005 / Frollo Ivan 1939 ; Tyšler Milan 1951 ; Juráš Vladimír 1978 ; MEASUREMENT 2005 5th International Conference on Measurement Language eng - English Country SK - Slovak Republic Document kind rozpis článkov z periodík (rzb) Category AED - Scientific papers in domestic peer-reviewed proceedings, monographs Category of document (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Type of document príspevok Year 2005 Registered in WOS article
rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2005
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