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Characteristics of silicon carbide detectors

  1. TitleCharacteristics of silicon carbide detectors
    Author Gurov J.B.
    Co-authors Rozov S.V.

    Sandukovskij V.G.

    Yakushev E.A.

    Hrubčín Ladislav 1951 SAVELEK - Elektrotechnický ústav SAV

    Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV    ORCID

    Source document Instruments and Experimental Techniques. Vol. 58, (2015), p. 22-24
    Languageeng - English
    Document kindrozpis článkov z periodík (rbx)
    CitationsSCIUTO, A. - TORRISI, L. - CANNAVO, A. - MAZZILLO, M. - CALCAGNO, L. In JOURNAL OF ELECTRONIC MATERIALS. NOV 2017, vol. 46, no. 11, p. 6403-6410.
    TORRISI, L. - SCIUTO, A. - CANNAVO, A. - DI FRANCO, S. - MAZZILLO, M. - BADALA, P. - CALCAGNO, L. In JOURNAL OF ELECTRONIC MATERIALS. JUL 2017, vol. 46, no. 7, p. 4242-4249.
    REJHON, Martin - BRYNZA, Mykola - GRILL, Roman - BELAS, Eduard - KUNC, Jan. Investigation of deep levels in semi-insulating vanadium-doped 4H-SiC by photocurrent spectroscopy. In PHYSICS LETTERS A, 2021, vol. 405, no., pp. ISSN 0375-9601. Dostupné na: https://doi.org/10.1016/j.physleta.2021.127433.
    FU, W.T. - WANG, L.N. - WANG, B. - CHU, X. - XUN, T. - YANG, H.W. Investigation on the photocurrent tail of vanadium-compensated 4H-SiC for microwave application. In AIP ADVANCES. SEP 1 2022, vol. 12, no. 9. Dostupné na: https://doi.org/10.1063/5.0111585.
    CategoryADMA - Scientific papers in foreign impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2015
    Registered inWOS
    Registered inSCOPUS
    DOI 10.1134/S0020441215010054
    article

    article

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    N
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    201520140.331Q40.254Q3
Number of the records: 1  

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