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Effect of HCN passivation on silicon oxide thin layer
Title Effect of HCN passivation on silicon oxide thin layer Author Kopani M. Pinčík Emil 1956 SAVFYZIK - Fyzikálny ústav SAV ORCID Co-authors Mikula M. Kobayashi H. Takahashi M. Source document Journal of the Chinese Advanced Materials Society. Vol. 5, no. 1 (2017), p. 57-64 Language eng - English Country CN - China Document kind rozpis článkov z periodík (rbx) Category ADEB - Scientific papers in other foreign journals not registered in Current Contents Connect without IF (non-impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2017 DOI 10.1080/22243682.2016.1256792 article
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Number of the records: 1