Compressive strain formation in surface-damaged crystals

Number of the records: 1

Title	Compressive strain formation in surface-damaged crystals
Author	Ferrari C.
Co-authors	Beretta S.
	Rotunno E.
	Korytár Dušan 1950 SAVELEK - Elektrotechnický ústav SAV ^ORCID
	Zápražný Zdenko 1980 SAVELEK - Elektrotechnický ústav SAV ^ORCID

Source document	Journal of Applied Crystallography. Vol. 53 (2020), part 3, p. 629-634
Language	eng - English
Document kind	rozpis článkov z periodík (rbx)
Citations	MASSA, E. - SASSO, C.P. - FRETTO, M. - MARTINO, L. - MANA, G. X-ray phase-contrast topography to measure the surface stress and bulk strain in a silicon crystal. In JOURNAL OF APPLIED CRYSTALLOGRAPHY. ISSN 0021-8898, OCT 2020, vol. 53, 5, p. 1195-1202.
	KLIMOVA, Nataliya - YEFANOV, Oleksandr - SNIGIREVA, Irina - SNIGIREV, Anatoly. Determination of the Exact Orientation of Single-Crystal X-ray Optics from Its Glitch Spectrum and Modeling of Glitches for an Arbitrary Configuration. In CRYSTALS, 2021, vol. 11, no. 5, pp. ISSN 2073-4352. Dostupné na: https://doi.org/10.3390/cryst11050504.
Category	ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
Category of document (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Type of document	článok
Year	2020
Registered in	WOS
Registered in	SCOPUS
Registered in	CCC
DOI	10.1107/S1600576720003702

article

	File name	Access	Size	Downloaded	Type	License
	Compressive strain formation in surface damaged crystals_sub.pdf	available	1.2 MB	0	Author's preprint

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
	A

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2020	2019	2.995	Q2	1.525	Q1

Number of the records: 1