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Monolithic integration of ultrafast photodetector and MESFET in the GaN material system
Title Monolithic integration of ultrafast photodetector and MESFET in the GaN material system Author Mikulics M. Co-authors Kordoš Peter SAVELEK - Elektrotechnický ústav SAV Gregušová Dagmar 1958 SAVELEK - Elektrotechnický ústav SAV ORCID Adam Roman Kočan M. Wu S. Zhang J. Sobolewski R. Grützmacher D. Marso M. Source document IEEE Photonics Technology Letters. Vol. 23 (2011), p. 1189-1191 Language slo - Slovak Document kind rozpis článkov z periodík (rbx) Citations LEE, C. - MATSUNO, F. - HASHIMOTO, Y. - OKADA, H. - SAWADA, K. - WAKAHARA, A. In JAPANESE JOURNAL OF APPLIED PHYSICS. APR 2012, vol. 51, no. 4, 1. AFZAL, N. - DEVARAJAN, M. - IBRAHIM, K. In MATERIALS RESEARCH EXPRESS. AUG 2016, vol. 3, no. 8. LIU, H.Y. - LIU, G.J. - HUANG, R.C. - SUN, W.C. - WEI, S.Y. - YU, S.M. In IEEE SENSORS JOURNAL. AUG 15 2017, vol. 17, no. 16, p. 5087-5092. LOU, G.L. - WU, Y.Y. - ZHU, H. - LI, J.Y. - CHEN, A.Q. - CHEN, Z.Y. - LIANG, Y.F. - REN, Y.H. - GUI, X.C. - ZHONG, D.Y. - QIU, Z.R. - TANG, Z.K. - SU, S.C. Upconversion single-microbelt photodetector via two-photon absorption simultaneous. In JOURNAL OF PHYSICS D-APPLIED PHYSICS. MAY 16 2018, vol. 51, no. 19. GAUBAS, E. - CEPONIS, T. - MICKEVICIUS, J. - PAVLOV, J. - RUMBAUSKAS, V. - VELICKA, M. - SIMOEN, E. - ZHAO, M. Pulsed photo-ionization spectroscopy in carbon doped MOCVD GaN epi-layers on Si. In SEMICONDUCTOR SCIENCE AND TECHNOLOGY. JUL 2018, vol. 33, no. 7. SUN, K.X. - VALLES, M. - VALENCIA, H. - NELSON, R.O. Gallium nitride (GaN) devices as a platform technology for radiation hard inertial confinement fusion diagnostics. In REVIEW OF SCIENTIFIC INSTRUMENTS. OCT 2018, vol. 89, no. 10. Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2011 Registered in WOS Registered in SCOPUS Registered in CCC DOI 10.1109/LPT.2011.2157816 
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rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore A rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2011 2010 1.989 Q1 1.457 Q1
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