Number of the records: 1  

In situ Raman observation of laser-induced formation of TlInSe2 crystallites in Tl-In-As-Se glass

  1. TitleIn situ Raman observation of laser-induced formation of TlInSe2 crystallites in Tl-In-As-Se glass
    Author Azhniuk Y.M.
    Co-authors Gomonnai A.V.

    Rubish V.M.

    Rigan M.Y.

    Solomon A.M.

    Gomonnai O.O.

    Guranich O.G.

    Petryshynets Ivan 1984 SAVMATVY - Ústav materiálového výskumu SAV    SCOPUS

    Zahn D.R.T.

    Source document Journal of Physics and Chemistry of Solids. Vol. 74 (2013), p. 1452-1458
    Languageeng - English
    CountryNL - Netherlands
    Document kindrozpis článkov z periodík (rbx)
    CitationsTRIPATHI, S.K. Irradiation induced changes in semiconducting thin films. In Defect and Diffusion Forum, 2013, 341, pp. 181-210.
    GU, Junsi - FAHRENKRUG, Eli - MALDONADO, Stephen. Analysis of the Electrodeposition and Surface Chemistry of CdTe, CdSe, and CdS Thin Films through Substrate-Overlayer Surface-Enhanced Raman Spectroscopy. In LANGMUIR. ISSN 0743-7463, 2014, vol. 30, no. 34, pp. 10344.
    PIASECKI, M. - MYRONCHUK, G. L. - ZAMURUEVA, O. V. - KHYZHUN, O. Y. - PARASYUK, O. V. - FEDORCHUK, A. O. - ALBASSAM, A. - EL-NAGGAR, A. M. - KITYK, I. V. Huge operation by energy gap of novel narrow band gap Tl1-xIn1-xBxSe2 (B = Si, Ge): DFT, x-ray emission and photoconductivity studies. In MATERIALS RESEARCH EXPRESS. ISSN 2053-1591, 2016, vol. 3, no. 2, pp.
    BALYTSKA, N.O. - MOSKVIN, P.P. - SKYBA, G.V. - RASHKOVETSKYI, L.V. - KRYZHANIVSKYY, V.B. - POLONSKYI, L.G. SPECIFIC FEATURES OF SURFACE RESEARCH OF ZnO-SiOsub2/sub FILMS BY MULTIFRACTAL ANALYSIS. In UKRAINIAN JOURNAL OF PHYSICS. ISSN 2071-0186, 2023, vol. 68, no. 12, p. 822-834. Dostupné na: https://doi.org/10.15407/ujpe68.12.822.
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2013
    Registered inWOS
    Registered inSCOPUS
    Registered inCCC
    DOI 10.1016/j.jpcs.2013.05.005
    article

    article

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    201320121.527Q20.728
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.