Analysis of structural defect states in thin films of small-molecular organic semiconductors using complex impedance data and DFT

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Title	Analysis of structural defect states in thin films of small-molecular organic semiconductors using complex impedance data and DFT
Author	Gmucová Katarína 1955 SAVFYZIK - Fyzikálny ústav SAV ^SCOPUS ^ORCID Nádaždy Vojtech 1961 SAVFYZIK - Fyzikálny ústav SAV ^SCOPUS ^ORCID

Co-authors	Konôpka Martin Feriancová Lucia Bokes Peter Putala Martin
Source document	AIP Conference Proceedings. Vol. 3054, no. 1 (2024), art. no. 020002
Language	eng - English
Country	US - United States of America
Document kind	rozpis článkov z periodík (rbx)
Category	ADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
Category of document (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Type of document	článok z podujatia
Year	2024
Registered in	SCOPUS
DOI	10.1063/5.0187451

article

	File name	Access	Size	Downloaded	Type	License
	Analysis of Structural Defect States in Thin Films of Small Molecular Organic Semiconductors Using Complex Impedance Data and DFT_2024.pdf	available	949.4 KB	4	Publisher's version

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
	N

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2024	2023			0.152

Number of the records: 1