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Defect-oriented test pattern generation for circuits with complex gates
Title Defect-oriented test pattern generation for circuits with complex gates Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV SCOPUS RID Kuzmicz W. Mikloš P. Pleskacz W. Source document ECS'01.Conference Proceedings : 3rd Electronic Circuits and Systems Conference. P. 3-6. - Bratislava, 2001 Language eng - English Country SK - Slovak Republic Document kind rozpis článkov z periodík (rzb) Category AFD - Published papers from domestic scientific conferences Year 2001 article
rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2001
Number of the records: 1