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Investigation of critical properties in MgB2/SiC/Si thin films prepared under varied conditions
Title Investigation of critical properties in MgB2/SiC/Si thin films prepared under varied conditions Author Nishida A. Co-authors Taka C. Chromik Štefan 1949 SAVELEK - Elektrotechnický ústav SAV ORCID Durný R. Source document Journal of Physics: Conference Series. Vol. 150, (2009), art. no. 052186 Language eng - English Country GB - Great Britian Document kind rozpis článkov z periodík (rbx) Category ADEB - Scientific papers in other foreign journals not registered in Current Contents Connect without IF (non-impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2009 article
rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore N rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2009 2008 0.264 Q3
Number of the records: 1