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Comparison of critical current scaling behaviors in MgB2/SiC/Si thin films

  1. TitleComparison of critical current scaling behaviors in MgB2/SiC/Si thin films
    Author Nishida A.
    Co-authors Taka C.

    Chromik Štefan 1949 SAVELEK - Elektrotechnický ústav SAV    ORCID

    Durný R.

    Source document Journal of Low Temperature Physics. Vol. 187, (2017), p. 565-572
    Languageeng - English
    Document kindrozpis článkov z periodík (rbx)
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2017
    Registered inWOS
    Registered inSCOPUS
    Registered inCCC
    DOI 10.1007/s10909-017-1777-z
    article

    article

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    201720161.300Q30.461Q2
Number of the records: 1  

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