TDR and TDT methods for measuring pulse characteristics of semiconductor devices

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Title	TDR and TDT methods for measuring pulse characteristics of semiconductor devices
Author	Vilhan Martin SAVMER - Ústav merania SAV
Co-authors	Šatka A.
	Priesol J.

Source document	Proceedings of ELITECH '19 : 21th Conference of Doctoral Students. P. non. - Bratislava, Slovak Republic : Slovak University of Technology, 2019 / Kozáková Alena ; Juhás G. ; Šály V. ; ELITECH '19 21th Conference of Doctoral Students
Language	eng - English
Country	SK - Slovak Republic
Document kind	rozpis článkov z periodík (rzb)
Category	AFD - Published papers from domestic scientific conferences
Year	2019

article

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2019

Number of the records: 1