Investigation of structural changes in AsxSe100-x amorphous thin films after electron beam irradiation with XAFS, XANES and Kelvin force microscopy

Number of the records: 1

Title	Investigation of structural changes in AsxSe100-x amorphous thin films after electron beam irradiation with XAFS, XANES and Kelvin force microscopy
Author	Shylenko O.
Co-authors	Bilanych B.
	Bilanych V.S.
	Latyshev Vitalii
	Saksl Karel 1974 SAVMATVY - Ústav materiálového výskumu SAV ^SCOPUS ^ORCID
	Molčanová Zuzana 1985 SAVMATVY - Ústav materiálového výskumu SAV ^SCOPUS ^ORCID
	Ballóková Beáta 1966 SAVMATVY - Ústav materiálového výskumu SAV ^ORCID
	Ďurišin Juraj Jr.
	Lytvyn P.M.
	Feher Alexander
	Rizak V.
	Komanický Vladimír

Source document	Applied Surface Science. Vol. 530 (2020), p. 147266
Language	eng - English
Country	NL - Netherlands
Document kind	rozpis článkov z periodík (rbx)
Category	ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
Category of document (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Type of document	článok
Year	2020
Registered in	WOS
Registered in	SCOPUS
Registered in	CCC
DOI	10.1016/j.apsusc.2020.147266

article

	File name	Access	Size	Downloaded	Type	License
	Investigation of structural changes in AsxSe100-x amorphous thin films after electron beam irradiation with XAFS, XANES and Kelvin force microscopy.pdf	available	3.9 MB	0	Publisher's version

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
	A

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2020	2019	6.182	Q1	1.230	Q1

Number of the records: 1