Characterization of monolithic InAlN/GaN NAND logic cell supported by device simulation

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Title	Characterization of monolithic InAlN/GaN NAND logic cell supported by device simulation
Author	Chvála A.
Co-authors	Nagy L.
	Marek J.
	Priesol J.
	Blaho Michal 1983 SAVELEK - Elektrotechnický ústav SAV
	Kuzmík Ján 1960 SAVELEK - Elektrotechnický ústav SAV ^ORCID
	Gregušová Dagmar 1958 SAVELEK - Elektrotechnický ústav SAV ^ORCID
	Príbytný P.
	Bernát M.
	Donoval D.
	Šatka A.

Source document	ADEPT 2017 : proceedings of the 5th International Conference on Advances in Electronic and Photonic Technologies, Podbanské, High Tatras, Slovakia, June 19-22, 2017. P. 40-43. - Žilina : University of Žilina, 2017 / Lettrichová I. ; Šušlik Ľ. ; Kováč Jaroslav Jr.
Language	eng - English
Document kind	rozpis článkov z periodík (rzb)
Category	AFD - Published papers from domestic scientific conferences
Year	2017
DOI	10.1109/TED.2018.2828464

article

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2017

Number of the records: 1