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Characteristics of Si and SiC detectors at registration of Xe ions

  1. TitleCharacteristics of Si and SiC detectors at registration of Xe ions
    Author Hrubčín Ladislav 1951 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Gurov J.B.

    Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV    ORCID

    Mitrofanov S.V.

    Rozov S.V.

    Sedlačková K.

    Sandukovsky V.G.

    Semin V.A.

    Nečas V.

    Skuratov V.A.

    Source document Journal of Instrumentation. Vol. 13 (2018), no. P11005
    Languageeng - English
    URLURL link
    Document kindrozpis článkov z periodík (rbx)
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2018
    Registered inWOS
    Registered inSCOPUS
    Registered inCCC
    DOI 10.1088/1748-0221/13/11/P11005
    article

    article

    File nameAccessSizeDownloadedTypeLicense
    Characteristics of Si and SiC detectors at registration of Xe ions.pdfNeprístupný/archív1.2 MB1Publisher's version
    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    201820171.258Q30.642Q2
Number of the records: 1  

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