Number of the records: 1
Atomic Force Microscopy
Title Atomic Force Microscopy : understanding basic modes and advanced applications Author Haugstad Greg Issue data Hoboken : John Wiley and Sons, Inc. , 2012. - 464 s. Language eng - English Country US - United States of America ISBN 978-0-470-63882-8 Catal.org. SAVEXFYZ Copy count 2, currently available 0, at library only 2 Document kind monografie 
book
Call number Location Sublocation Info 11645 Ústav exper. fyziky SAV In-Library Use Only 11652 Ústav exper. fyziky SAV In-Library Use Only
Number of the records: 1