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Characterization of epitaxial 4H-SiC as a material for spectrometric radiation detectors

  1. TitleCharacterization of epitaxial 4H-SiC as a material for spectrometric radiation detectors
    Author Dubecký František 1946 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Gombia E.

    Vanko Gabriel 1981 SAVELEK - Elektrotechnický ústav SAV    ORCID

    Ferrari C.

    Ferrari C.

    Baldini M.

    Ryc L.

    Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV    ORCID

    Nečas V.

    Source document / Pudiš D. ; Kubicova I. ; Bury P. APCOM 2011 : proceedings of the 17th International Conference on Applied Physics of Condensed Matter, held in SPA Nový Smokovec, High Tatras, Slovakia, June 22-24, 2011. P. 240-243. - Žilina : University of Žilina, 2011
    Languageslo - Slovak
    Document kindrozpis článkov z periodík (rzb)
    CategoryAED - Scientific papers in domestic peer-reviewed proceedings, monographs
    Category of document (from 2022)V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka
    Type of documentpríspevok
    Year2011
    article

    article

    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    2011
Number of the records: 1  

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