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Trap analysis in GaN-based heterostructures using current transients measurements
Title Trap analysis in GaN-based heterostructures using current transients measurements Author Florovič M. Co-authors Škriniarová Jaroslava Gregušová Dagmar 1958 SAVELEK - Elektrotechnický ústav SAV ORCID Kováč Jaroslav Kordoš Peter Source document ASDAM 2016 : the 11th International Conference on Advanced Semiconductor Devices and Microsystems. P. 185-188. - : IEEE, 2016 / Haščík Štefan 1956 ; Dzuba Jaroslav 1987 ; Vanko Gabriel 1981 Language eng - English Document kind rozpis článkov z periodík (rzb) Category ADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2016 Registered in WOS Registered in SCOPUS DOI 10.1109/ASDAM.2016.7805926 article
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