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Investigation of interfaces and threshold voltage instabilities in normally-off MOS-gated InGaN/AlGaN/GaN HEMTs
Title Investigation of interfaces and threshold voltage instabilities in normally-off MOS-gated InGaN/AlGaN/GaN HEMTs Author Pohorelec Ondrej SAVELEK - Elektrotechnický ústav SAV Co-authors Ťapajna Milan 1977 SAVELEK - Elektrotechnický ústav SAV ORCID Gregušová Dagmar 1958 SAVELEK - Elektrotechnický ústav SAV ORCID Gucmann Filip 1987 SAVELEK - Elektrotechnický ústav SAV ORCID Hasenöhrl Stanislav 1956 SAVELEK - Elektrotechnický ústav SAV ORCID Haščík Štefan 1956 SAVELEK - Elektrotechnický ústav SAV Stoklas Roman 1981 SAVELEK - Elektrotechnický ústav SAV ORCID Seifertová Alena 1958 SAVELEK - Elektrotechnický ústav SAV Pécz B. Tóth L. Kuzmík Ján 1960 SAVELEK - Elektrotechnický ústav SAV ORCID Source document Applied Surface Science. Vol. 528 (2020), no. 146824 Language eng - English Document kind rozpis článkov z periodík (rbx) Citations TIAN, Y. - WEI, R.S. - SHAO, Y.L. - HAO, X.P. - WU, Y.Z. - ZHANG, L. - DAI, Y.B. - HUO, Q. - ZHANG, B.G. - HU, H.X. Comparison of Defects in Hydride Vapor Phase Epitaxy-Grown GaN Films under Different V/III Ratios and the Influence on the Electrical and Optical Properties. In INTERNATIONAL JOURNAL OF ELECTROCHEMICAL SCIENCE. ISSN 1452-3981, DEC 2020, vol. 15, no. 12, p. 12682-12689. Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2020 Registered in WOS Registered in SCOPUS Registered in CCC DOI 10.1016/j.apsusc.2020.146824 article
File name Access Size Downloaded Type License Investigation of Interfaces and Threshold Voltage Instabilities_submitt.pdf available 1 MB 6 Author's preprint Investigation of interfaces and threshold voltage.pdf Neprístupný/archív 1.2 MB 1 Publisher's version rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore A rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2020 2019 6.182 Q1 1.230 Q1
Number of the records: 1