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Identification of the crystalline-phases in thin pentacene layers by Raman spectroscopy

  1. TitleIdentification of the crystalline-phases in thin pentacene layers by Raman spectroscopy
    Author Srnánek R.
    Co-authors Jakabovič J.

    Kováč Jaroslav

    Kováč Jaroslav Jr.

    Haško D.

    Šatka A.

    Dobročka Edmund 1955 SAVELEK - Elektrotechnický ústav SAV    ORCID

    Donoval D.

    Source document Vacuum. Vol. 86, (2012), p.627-629
    Languageeng - English
    Document kindrozpis článkov z periodík (rbx)
    CitationsHOFER, A. - BIBERGER, R. - BENSTETTER, G. - WILKE, B. - GOBEL, H. In MICROELECTRONICS RELIABILITY. SEP-NOV 2013, vol. 53, no. 9-11, SI, p. 1430-1433.
    TOMOVIC, A.Z. - SAVIC, J.J. - BAKIC, N.L. - BORTEL, G. - FAIGEL, G. - ZIKIC, R. - JOVANOVIC, V.P. In VACUUM. OCT 2017, vol. 144, p. 36-42.
    ZHAO, H.L. - CLEMMEN, S. - RAZA, A. - BAETS, R. Stimulated Raman spectroscopy of analytes evanescently probed by a silicon nitride photonic integrated waveguide. In OPTICS LETTERS. MAR 15 2018, vol. 43, no. 6, p. 1403-1406.
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2012
    Registered inWOS
    Registered inSCOPUS
    Registered inCCC
    DOI 10.1016/j.vacuum.2011.07.012
    article

    article

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    201220111.317Q20.570Q2
Number of the records: 1  

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