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Hierarchical defect-oriented fault simulation for digital circuits
Title Hierarchical defect-oriented fault simulation for digital circuits Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV SCOPUS RID Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Source document IEEE European Test Workshop. Order No. PROO390 (2000), p. 69-74. - Los Alamitos, California : IEEE Computer Society Language eng - English Country US - United States of America Document kind rozpis článkov z periodík (rzb) Citations AHMAD, A. - AL-ABRI, D. Design of a dynamic test tool in the area of digital system testing. In International Conference on Communication, Computer and Power - icccp´09. ISSN 1813-419X. 2009, p. 9-12. Category ADC Year 2000 Registered in WOS article
rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2000
Number of the records: 1