Patterned xy grids and a multistep height sample for calibration of profilometers and scanning probe microscopes.

Number of the records: 1

Title	Patterned xy grids and a multistep height sample for calibration of profilometers and scanning probe microscopes.
Author	Picotto G.B.
Co-authors	Hudek Peter 1953- SAVINFO - Ústav informatiky SAV ^SCOPUS ^RID ^ORCID
	Kostič Ivan 1955- SAVINFO - Ústav informatiky SAV ^SCOPUS ^RID ^ORCID
	Matay Ladislav 1950- SAVINFO - Ústav informatiky SAV ^SCOPUS ^RID
	Hrkút Pavol 1948- SAVINFO - Ústav informatiky SAV ^SCOPUS ^RID
	Pisani M.

Source document	EUSPEN 1st Conference : Proceedings. P. 203-206. - Bremen, Germany, 1999
Language	eng - English
Country	DE - Germany
Document kind	rozpis článkov z periodík (rzb)
Category	AFC - Published papers from foreign scientific conferences
Year	1999
Registered in	WOS

article

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
1999

Number of the records: 1