Defect-oriented test generation using probabilistic estimation

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Title	Defect-oriented test generation using probabilistic estimation
Author	Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV
Co-authors	Fischerová Mária 1955- ^SCOPUS
	Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV ^SCOPUS ^RID
	Kuzmicz W.
	Pleskacz W.
	Raik J.
	Ubar R.

Source document	Proceedings of the 8th International Conference MIXDES 2001 : Mixed Design of Integrated Circuits and Systems. P. 131-136. - Poland : Andrzej Napieralski, 2001
Language	eng - English
Document kind	rozpis článkov z periodík (rzb)
Category	AFC - Published papers from foreign scientific conferences
Year	2001

article

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2001

Number of the records: 1