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Measurement of generation parameters on Ru/HfO2/Si MOS capacitor

  1. TitleMeasurement of generation parameters on Ru/HfO2/Si MOS capacitor
    Author Ťapajna Milan 1977 SAVELEK - Elektrotechnický ústav SAV    ORCID
    Co-authors Harmatha L.

    Hušeková Kristína 1957 SAVELEK - Elektrotechnický ústav SAV

    Source document Solid-State Electronics. Vol. 50, (2006), p. 177-180
    Languageeng - English
    CountryNL - Netherlands
    Document kindrozpis článkov z periodík (rbx)
    CitationsMUKHOPADHYAY, A.B. - SANZ, J.F. - MUSGRAVE, C.B. In JOURNAL OF PHYSICAL CHEMISTRY C. ISSN 1932-7447, JUL 5 2007, vol. 111, no. 26, p. 9203-9210.
    MUKHOPADHYAY, A.B. - SANZ, J.F. - MUSGRAVE, C.B. In JOURNAL OF MATERIALS SCIENCE. SEP 2010, vol. 45, no. 18, p. 4924-4928.
    BENKOVSKA, J. - STUCHLIKOVA, L. - BUC, D. - CAPLOVIC, L. In PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. JUL 2012, vol. 209, no. 7, p. 1384-1389.
    TOPRASERTPONG, K. - TAHARA, K. - TAKENAKA, M. - TAKAGI, S. Evaluation of polarization characteristics in metal/ferroelectric/semiconductor capacitors and ferroelectric field-effect transistors. In APPLIED PHYSICS LETTERS. ISSN 0003-6951, JUN 15 2020, vol. 116, no. 24.
    MUKHERJEE, S. - BIZINDAVYI, J. - CLIMA, S. - POPOVICI, M.I. - PIAO, X.Y. - KATCKO, K. - CATTHOOR, F. - YU, S.M. - AFANAS'EV, V.V. - VAN HOUDT, J. Capacitive Memory Window With Non-Destructive Read in Ferroelectric Capacitors. In IEEE ELECTRON DEVICE LETTERS. ISSN 0741-3106, JUL 2023, vol. 44, no. 7, p. 1092-1095. Dostupné na: https://doi.org/10.1109/LED.2023.3278599.
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2006
    article

    article

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    200620051.247Q20.935Q1
Number of the records: 1  

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