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Finite element simulation of metal-semiconductor-metal photodetector
Title Finite element simulation of metal-semiconductor-metal photodetector Author Guarino G. Co-authors Donaldson W.R. Mikulics M. Marso M. Kordoš Peter SAVELEK - Elektrotechnický ústav SAV Sobolewski R. Source document Solid-State Electronics. Vol. 53 (2009), p. 1144-1148 Language eng - English Country GB - Great Britian Document kind rozpis článkov z periodík (rbx) Citations HARZALLAH, G. - REMRAM, M. In CHINESE OPTICS LETTERS. OCT 10 2011, vol. 9, no. 10. WANG, P. - ZHEN, Q.H. - TANG, Q. - YANG, Y.T. - GUO, L.X. - DING, K. - HUANG, F. In OPTICS EXPRESS. JUL 29 2013, vol. 21, no. 15, p. 18387-18397. DEBBAR, N. In INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. MAR-APR 2016, vol. 29, no. 2, p. 333-342. KHORSHIDI, M. - DADASHZADEH, G. In JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES. MAY 2017, vol. 38, no. 5, p. 609-629. AHMED, Anas A. - HASHIM, M. R. - ABDALRHEEM, Raed - RASHID, Marzaini. High-performance multicolor metal-semiconductor-metal Si photodetector enhanced by nanostructured NiO thin film. In JOURNAL OF ALLOYS AND COMPOUNDS. ISSN 0925-8388, 2019, vol. 798, no., pp. 300-310. QODRATNAMA, Arash - KHUNJUSH, Farshad - RAJI, Mohsen. A methodology for the SPICE-Compatible modelling of metal-semiconductor-metal photodetectors for nanophotonic interconnects application. In MICROELECTRONICS JOURNAL. ISSN 0026-2692, 2021, vol. 115, no., pp. Dostupné na: https://doi.org/10.1016/j.mejo.2021.105170. Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2010 
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rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore A rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2009 2008 1.422 Q2 0.861 Q1
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