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Design and test technology for dependable systems-on-chip
Title Design and test technology for dependable systems-on-chip Author Ubar Raimund Co-authors Raik J. Vierhaus Heinrich T. Issue data New York : Information Science Reference , 2011. - ebook Language eng - English Country US - United States of America Document kind monografie Category AAA - Scientific monographs published abroad References (2) Publication Activity of SAV - Articles book
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