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Confidence interval for the distance of two micro/nano structures and its applications in dimensional metrology
Title Confidence interval for the distance of two micro/nano structures and its applications in dimensional metrology Author Wimmer Gejza 1949- SAVMATEM - Matematický ústav SAV Co-authors Karovič Karol 1939 SAVMER - Ústav merania SAV Witkovský Viktor 1963 SAVMER - Ústav merania SAV SCOPUS RID ORCID Köning R. Source document MEASUREMENT 2011 : 8th International Conference on Measurement. P. 80-83. - Bratislava : Institute of Measurement Science SAS, 2011 / Maňka Ján 1961 ; Witkovský Viktor 1963 ; Tyšler Milan 1951 ; Frollo Ivan 1939 ; MEASUREMENT 2011 8th International Conference on Measurement Language eng - English Country SK - Slovak Republic Document kind rozpis článkov z periodík (rzb) Citations DG7 (Discussion Group on Line Scales) Report to CCL (Consultative Committee for Length). CCL/12-37-01. BIMP HQ, Sèvres, France, 2012. Category AED - Scientific papers in domestic peer-reviewed proceedings, monographs Category of document (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Type of document príspevok Year 2011 
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rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2011
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