TEM analysis of InMnAs layers and dots prepared by low pressure MOVPE

Number of the records: 1

Title	TEM analysis of InMnAs layers and dots prepared by low pressure MOVPE
Author	Križanová Zuzana SAVELEK - Elektrotechnický ústav SAV
Co-authors	Vávra Ivo 1949 SAVELEK - Elektrotechnický ústav SAV
	Hasenöhrl Stanislav 1956 SAVELEK - Elektrotechnický ústav SAV ^ORCID
	Novák Jozef 1951 SAVELEK - Elektrotechnický ústav SAV

Source document	Vacuum. Vol. 86, (2012), p. 657-660
Language	eng - English
Document kind	rozpis článkov z periodík (rbx)
Citations	BOURAVLEUV, A.D. - NEVEDOMSKII, V.N. - UBYIVOVK, E.V. - SAPEGA, V.F. - KHREBTOV, A.I. - SAMSONENKO, Y.B. - CIRLIN, G.E. - USTINOV, V.M. In SEMICONDUCTORS. AUG 2013, vol. 47, no. 8, p. 1037-1040.
	BOURAVLEUV, A. - SAPEGA, V. - NEVEDOMSKII, V. - KHREBTOV, A. - SAMSONENKO, Y. - CIRLIN, G. In APPLIED PHYSICS LETTERS. DEC 8 2014, vol. 105, no. 23.
	BOURAVLEUV, A. - CIRLIN, G. - REZNIK, R. - KHREBTOV, A. - SAMSONENKO, Y. - WERNER, P. - SOSHNIKOV, I. - SAVIN, A. - LIPSANEN, H. In PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS. JUL 2016, vol. 10, no. 7, p. 554-557.
Category	ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
Category of document (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Type of document	článok
Year	2012
Registered in	WOS
Registered in	SCOPUS
Registered in	CCC
DOI	10.1016/j.vacuum.2011.07.036

article

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
	A

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2012	2011	1.317	Q2	0.570	Q2

Number of the records: 1