Number of the records: 1  

Unexpected current lowering by a low work-function metal contact: Mg/SI-GaAs

  1. TitleUnexpected current lowering by a low work-function metal contact: Mg/SI-GaAs
    Author Dubecký František 1946 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Dubecký Matúš 1982 SAVELEK - Elektrotechnický ústav SAV

    Hubík P.

    Kindl D.

    Gombia E.

    Baldini M.

    Nečas V.

    Source document Solid-State Electronics. Vol. 82, (2013), p. 72-76
    Languageeng - English
    Document kindrozpis článkov z periodík (rbx)
    CitationsCHEN, B.B. - CHEN, J.H. - SHEN, Y.J. - GE, K.P. - GUO, J.X. - LI, F. - LIU, H.X. - XU, Y. - MAI, Y.H. In APPLIED PHYSICS LETTERS. MAR 27 2017, vol. 110, no. 13.
    CHERNYKH, S.V. - CHERNYKH, A.V. - CHUBENKO, A.P. - PAVLYUCHENKO, L.N. - SVESHNIKOV, Y.N. - GLYBIN, Y.N. - KONOVALOV, M.P. - PANICHKIN, A.V. - DIDENKO, S.I. Detectors on the Basis of High-Purity Epitaxial GaAs Layers for Spectrometry of X and Gamma Rays. In INSTRUMENTS AND EXPERIMENTAL TECHNIQUES. SEP 2018, vol. 61, no. 5, p. 665-672.
    JIANG, H.Y. - YANG, X.L. - WEN, Z.X. - GE, K.P. - LI, F. - CHEN, J.W. - XU, Y. - SONG, D.Y. - CHEN, J.H. Considerably Improved Photovoltaic Performances of ITO/Si Heterojunction Solar Cells by Incorporating Hydrogen Into Near-Interface Region. In IEEE JOURNAL OF PHOTOVOLTAICS. ISSN 2156-3381, SEP 2022, vol. 12, no. 5, p. 1102-1108. Dostupné na: https://doi.org/10.1109/JPHOTOV.2022.3179940.
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2013
    Registered inWOS
    Registered inSCOPUS
    Registered inCCC
    DOI 10.1016/j.sse.2013.01.021
    article

    article

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    201320121.482Q20.828Q1
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.