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Optical Characteristic Measurement Device
Title Optical Characteristic Measurement Device : Patent WO 2012/121323 A1. (Assignee: National Institute of Advanced Industrial Science and Technology, Tokyo, Japan) Author Kawate E. Co-authors Hain Miroslav 1960 SAVMER - Ústav merania SAV SCOPUS RID ORCID Issue data Japan Patent Office , September 13, 2012 Language eng - English Country JP - Japan Document kind monografie Category AGJ - Patent applications, utility model applications, design applications, trademark applications, applications for granting supplementary protection certificate, applications for registration of topographies of semiconductor products, designations of origin applications, geographical indications of goods and products applications, breeder's certificate applications Year 2012 
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Number of the records: 1