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Atomic force microscopy identification of Al-sites on ultrathin aluminum oxide film on NiAl(110)
Title Atomic force microscopy identification of Al-sites on ultrathin aluminum oxide film on NiAl(110) Author Li Yan Jun Co-authors Brndiar Ján 1980 SAVFYZIK - Fyzikálny ústav SAV RID ORCID Štich Ivan 1959 SAVFYZIK - Fyzikálny ústav SAV ORCID Co-authors Naitoh Y. Sugawara Y. Source document Nanotechnology. Vol. 26, no. 50 (2015), 505704 Language eng - English URL URL link Document kind rozpis článkov z periodík (rbx) Citations XING, Yage - XU, Qinglian - YANG, Simon X. - CHEN, Cunkun - TANG, Yong - SUN, Shumin - ZHANG, Liang - CHE, Zhenming - LI, Xihong. Preservation Mechanism of Chitosan-Based Coating with Cinnamon Oil for Fruits Storage Based on Sensor Data. In SENSORS. ISSN 1424-8220, 2016, vol. 16, no. 7, 1111. KRUKOWSKI, Pawel - CHAUNCHAIYAKUL, Songpol - MINAGAWA, Yuto - YAJIMA, Nami - AKAI-KASAYA, Megumi - SAITO, Akira - KUWAHARA, Yuji. Anomalous hexagonal superstructure of aluminum oxide layer grown on NiAl(110) surface. In NANOTECHNOLOGY. ISSN 0957-4484, 2016, vol. 27, no. 45, 455708. DAI, Zongbei - ALYABYEVA, Natalia - VAN DEN BOSSCHE, Maxime - BORGHETTI, Patrizia - CHENOT, Stephane - DAVID, Pascal - KOLTSOV, Alexey - RENAUD, Gilles - JUPILLE, Jacques - CABAILH, Gregory - NOGUERA, Claudine - GONIAKOWSKI, Jacek - LAZZARI, Remi. Oxide at the Al-rich Fe0.85Al0.15(110) surface. In PHYSICAL REVIEW MATERIALS. ISSN 2475-9953, 2020, vol. 4, no. 7, 074409. XING, Yage - LI, Xuanlin - GUO, Xunlian - LI, Wenxiu - CHEN, Jianwen - LIU, Qian - XU, Qinglian - WANG, Qin - YANG, Hua - SHUI, Yuru - BI, Xiufang. Effects of Different TiO(2)Nanoparticles Concentrations on the Physical and Antibacterial Activities of Chitosan-Based Coating Film. In NANOMATERIALS, 2020, vol. 10, no. 7, 1365. Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2015 Registered in WOS Registered in SCOPUS Registered in CCC DOI 10.1088/0957-4484/26/50/505704 
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File name Access Size Downloaded Type License Atomic force microscopy identification of Al- sites on ultrathin aluminum oxide film on NiAl(110).pdf Neprístupný/archív 1.5 MB 1 Publisher's version rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore A rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2015 2014 3.821 Q1 1.497 Q1
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