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X-ray diffraction analysis of residual stresses in textured ZnO thin films
Title X-ray diffraction analysis of residual stresses in textured ZnO thin films Author Dobročka Edmund 1955 SAVELEK - Elektrotechnický ústav SAV ORCID Co-authors Novák P. Búc D. Harmatha L. Murín J. Source document Applied Surface Science. Vol. 395 (2017), p. 16-23 Language eng - English Document kind rozpis článkov z periodík (rbx) Citations XI, Y.T. - GAO, K.W. - PANG, X.L. - YANG, H.S. - XIONG, X.T. - LI, H. - VOLINSKY, A.A. In CERAMICS INTERNATIONAL. OCT 15 2017, vol. 43, no. 15, p. 11992-11997. LI, J.W. - ZHANG, W.M. - ZENG, W.Q. - CHEN, G.L. - QIU, Z.C. - CAO, X.Y. - GAO, X.Y. In PLOS ONE. NOV 16 2017, vol. 12, no. 11. QIAN, J. - CHEN, X. - SUN, L.M. - YAO, G.W. - WANG, X. Numerical and Experimental Identification of Seven-Wire Strand Tensions Using Scale Energy Entropy Spectra of Ultrasonic Guided Waves. In SHOCK AND VIBRATION. 2018. GAO, W. - JI, J.W. - WANG, C. - WANG, L.L. - FAN, Q.C. - SUN, K.H. - JI, F. - XU, M. Mitigation of subsurface damage in potassium dihydrogen phosphate (KDP) crystals with a novel abrasive-free jet process. In OPTICAL MATERIALS EXPRESS. SEP 1 2018, vol. 8, no. 9, p. 2625-2635. PINTO, Rui M. R. - CHU, Virginia - CONDE, Joao Pedro. Amorphous Silicon Self-Rolling Micro Electromechanical Systems: From Residual Stress Control to Complex 3D Structures. In ADVANCED ENGINEERING MATERIALS. ISSN 1438-1656, 2019, vol. 21, no. 9, pp. WANG, Junxia - CHEN, Xiaochuan - CAO, Changlin - YU, Dingshan - YAN, Shilin. New insight into residual stresses in amine-grafted MWCNTs/binary resin composites under complex thermomechanical loadings. In JOURNAL OF THERMOPLASTIC COMPOSITE MATERIALS. ISSN 0892-7057, 2019, vol. 32, no. 11, pp. 1445-1454. MOTAZEDIAN, Fakhrodin - WU, Zhigang - ZHANG, Junsong - SHARIAT, Bashir Samsam - JIANG, Daqiang - MARTYNIUK, Mariusz - LIU, Yinong - YANG, Hong. Determining intrinsic stress and strain state of fibre-textured thin films by X-ray diffraction measurements using combined asymmetrical and Bragg-Brentano configurations. In MATERIALS & DESIGN. ISSN 0264-1275, 2019, vol. 181, no., pp. YANG, Weijia - LIU, Junjie - LIU, Mingquan - LIU, Yanyi - WANG, Nuoyuan - SHEN, Gengzhe - LIU, Zhihao - HE, Xin - ZHANG, Chi - HU, Linshun - FU, Yuechun. Fabrication of preferential orientation ZnO thin films with exposed holes by high temperature annealing low-temperature-grown ZnO thin films on different substrates. In SUPERLATTICES AND MICROSTRUCTURES. ISSN 0749-6036, 2019, vol. 136, no., pp. WANG, Xiaopeng - LI, Xiaoyan - WU, Qi - XU, Zhou. Influence Mechanism of Texture on the Accuracy of X-ray Stress Measurement for 6061-T6 Aluminum Alloy. In Cailiao Daobao/Materials Reports. ISSN 1005023X, 2020-10-25, 34, 20, pp. 20081-20085. MISHUROVA, T. - BRUNO, G. - EVSEVLEEV, S. - SEVOSTIANOV, I. Determination of macroscopic stress from diffraction experiments: A critical discussion. In JOURNAL OF APPLIED PHYSICS. ISSN 0021-8979, JUL 14 2020, vol. 128, no. 2. BOLANOS, J.D.M. - RODRIGUEZ-PAEZ, J.E. WO(3 )mono-nanocrystals: Synthesis, characterization and evaluation of their electrical behavior in and acetone. In MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS. ISSN 0921-5107, DEC 2021, vol. 274. KUMAR, M.D.B. - MANIKANDAN, M. Assessment of Process, Parameters, Residual Stress Mitigation, Post Treatments and Finite Element Analysis Simulations of Wire Arc Additive Manufacturing Technique. In METALS AND MATERIALS INTERNATIONAL. ISSN 1598-9623, JAN 2022, vol. 28, no. 1, p. 54-111. PENG, Y. - ZHAO, J. - CHEN, L.S. - DONG, J. Residual stress measurement combining blind-hole drilling and digital image correlation approach. In JOURNAL OF CONSTRUCTIONAL STEEL RESEARCH. ISSN 0143-974X, JAN 2021, vol. 176. KANO, S. - YANG, H.L. - MURAKAMI, K. - ABE, H. Modification of the high fluence irradiation facility at the University of Tokyo: Assessment of radiation-induced amorphization of Zr(Cr,Fe)2 Laves phase under 180 keV-He+ irradiation. In NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. ISSN 0168-583X, NOV 15 2022, vol. 531, p. 1-8. Dostupné na: https://doi.org/10.1016/j.nimb.2022.09.017. TRUONG, T.A. - NGUYEN, T.K. - ZHAO, H.B. - NGUYEN, N.K. - DINH, T. - PARK, Y. - NGUYEN, T. - YAMAUCHI, Y. - NGUYEN, N.T. - PHAN, H.P. Engineering Stress in Thin Films: An Innovative Pathway Toward 3D Micro and Nanosystems. In SMALL. ISSN 1613-6810, JAN 2022, vol. 18, no. 4. Dostupné na: https://doi.org/10.1002/smll.202105748. YANG, H.T. - LIU, M. - ZHU, Y.M. - WANG, W.D. - QIN, X.M. - HE, L.L. - JIANG, K.Y. Characterization of Residual Stress in SOI Wafers by Using MEMS Cantilever Beams. In MICROMACHINES. AUG 2023, vol. 14, no. 8. Dostupné na: https://doi.org/10.3390/mi14081510. ZHANG, C.Y. - CHEN, S.Y. - XIE, L.G. - YANG, E.C. - BU, T. - CHEUNG, I. - JEAN, M.D. Multi-objective Optimization of Laser Welds with Mixed WC/Co/Ni Experiments Using Simplex-centroid Design. In MATERIALS SCIENCE-MEDZIAGOTYRA. ISSN 1392-1320, 2023, vol. 29, no. 4, p. 445-455. Dostupné na: https://doi.org/10.5755/j02.ms.33626. CAO, H.X. - YAO, C.B. - LI, H.Y. - SHI, B.Y. - ZHENG, X.Y. - LIU, Y. - YIN, H.T. Band gap and interface engineering of ZnO@MoSe2heterojunction film and its light-matter coupling. In OPTICAL MATERIALS. ISSN 0925-3467, FEB 2023, vol. 136. Dostupné na: https://doi.org/10.1016/j.optmat.2022.113410. LI, P.X. - YAN, Y.T. - BA, J. - WANG, P.C. - WANG, H.H. - WANG, X.X. - LIN, J.H. - CAO, J. - QI, J.L. The regulation strategy for releasing residual stress in ceramic-metal brazed joints. In JOURNAL OF MANUFACTURING PROCESSES. ISSN 1526-6125, JAN 6 2023, vol. 85, p. 935-947. Dostupné na: https://doi.org/10.1016/j.jmapro.2022.12.022. Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2017 Registered in WOS Registered in SCOPUS Registered in CCC DOI 10.1016/j.apsusc.2016.06.060 
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File name Access Size Downloaded Type License X ray diffraction analysis of residual stresses in textured ZnO thin films.pdf Neprístupný/archív 1.7 MB 0 Publisher's version rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore A rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2017 2016 3.387 Q1 0.958 Q1
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