Few-tilt electron ptychotomography: a new method to determine the 3D structure of 2D materials with high-precision and low-dose

Number of the records: 1

Title	Few-tilt electron ptychotomography: a new method to determine the 3D structure of 2D materials with high-precision and low-dose
Author	Hofer C.
Co-authors	Mustonen K.
	Skákalová Viera SAVELEK - Elektrotechnický ústav SAV
	Pennycook T.J.

Source document	Microscopy and Microanalysis. Vol. 28, no. S1 (2022), p. 2526-2527
Language	eng - English
Country	US - United States of America
Document kind	rozpis článkov z periodík (rbx)
Category	ADEB - Scientific papers in other foreign journals not registered in Current Contents Connect without IF (non-impacted)
Category of document (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Type of document	článok z podujatia
Year	2022
DOI	10.1017/S1431927622009655

article

	File name	Access	Size	Downloaded	Type	License
	Few-tilt Electron Ptychotomography.pdf	Neprístupný/archív	463.1 KB	9	Publisher's version

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
	N

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2022	2021	4.099	Q1	0.379	Q3

Number of the records: 1