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Title Hierarchical defect-oriented fault simulation for digital circuits Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Source document ETW 2000 - Informal Digest : IEEE European Test Workshop. P. 151-156 / Prinetto P. ; Teixiera J.P. ; Teixiera I.M.C. ; Flottes M.L.. - Los Alamitos : IEEE, 2000 Category AFC - Published papers from foreign scientific conferences Year 2000 
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Title Hierarchical defect-oriented fault simulation for digital circuits Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Source document IEEE European Test Workshop. Order No. PROO390 (2000), p. 69-74. - Los Alamitos, California : IEEE Computer Society Category ADC Year 2000 article
Title Hierarchical Defect Level Test Quality Analysis Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Action User Forum Slovakia 2000. Moderné elektronické obvody a systémy - Zborník prednášok a posterov : 7.4. : Kongresové centrum SAV, zámok Smolenice Source document 2nd User Forum. P. 83-93. - Bratislava, 2000 Category AFC - Published papers from foreign scientific conferences Year 2000 article
Title Defect oriented fault coverage of 100% stuck-at fault test set Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Action Mixdes 2000 - Mixed design of integrated circuits and systems. Proceedings of the 7th International Conference : 15.-17.06. : Gdynia, Poland Source document Mixed design of integrated circuits and systems. P. 511-516 Category AFC - Published papers from foreign scientific conferences Year 2000 article