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Title Hierarchical test generation for combinational circuits with real defects coverage Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Fischerová Mária 1955- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Pleskacz W. Raik J. Ubar R. Source document Microelectronics reliability. No. 42 (2002), s. 1141-1149 Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Year 2002 DOI 10.1016/S0026-2714(02)00080-X 
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Title Internet-based collaborative test generation with MOSCITO Author Schneider Andrea Co-authors Ivask E. Mikloš P. Raik J. Diener K.-H. Ubar R. Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Action 2002 Design, Automation and Test in Europe Conference and Exhibition : March 4-8, 2002 : Paris, France Source document 2002 Design, Automation and Test in Europe Conference and Exhibition. Proceedings. P. 221-226. - Los Alamitos, California : The Institute of Electrical and Electronics Engineers, Inc., 2002 Category ADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus Year 2002 DOI 10.1109/DATE.2002.998273 article
Title Defect-oriented library builder and hierarchical test generation Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Pleskacz W. Raik J. Ubar R. Action 4th International Workshop on IEEE DDECS 2001 ( 4th : April 18-20, 2001 : Györ, Hungary ) Source document Proceedings of IEEE Design and Diagnostics of electronic circuits and systems Workshop 2001. P. 163-168. - Hungary : SZIF-UNIVERSITAS Ltd., 2001 Category AFC - Published papers from foreign scientific conferences Year 2001 article
Title Defect-oriented test pattern generation for circuits with complex gates Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Mikloš P. Pleskacz W. Action 3rd Electronic Circuits and Systems Conference 2001 ( 3rd : September 5-7, 2001 : Bratislava ) Source document ECS'01.Conference Proceedings : 3rd Electronic Circuits and Systems Conference. P. 3-6. - Bratislava, 2001 Category AFD - Published papers from domestic scientific conferences Year 2001 article
Title Defect-oriented test generation using probabilistic estimation Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Fischerová Mária 1955- Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Pleskacz W. Raik J. Ubar R. Action 8th International Conference MIXDES 2001 ( 8th : June 21-23, 2001 : Zakopane, Poland ) Source document Proceedings of the 8th International Conference MIXDES 2001 : Mixed Design of Integrated Circuits and Systems. P. 131-136. - Poland : Andrzej Napieralski, 2001 Category AFC - Published papers from foreign scientific conferences Year 2001 article
Title Hierarchical defect-oriented fault simulation for digital circuits Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Source document ETW 2000 - Informal Digest : IEEE European Test Workshop. P. 151-156 / Prinetto P. ; Teixiera J.P. ; Teixiera I.M.C. ; Flottes M.L.. - Los Alamitos : IEEE, 2000 Category AFC - Published papers from foreign scientific conferences Year 2000 article
Title Hierarchical defect-oriented fault simulation for digital circuits Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Source document IEEE European Test Workshop. Order No. PROO390 (2000), p. 69-74. - Los Alamitos, California : IEEE Computer Society Category ADC Year 2000 article
Title Fault simulation for combined Iddq and voltage testing for combinational circuits Author Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Co-authors Gašpar Ján Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Action 3rd DDECS Workshop. Design and Diagnostics of Electronic Circuits and Systems ( 3rd : April 5-7, 2000 : Smolenice castle, Slovakia ) Source document Design and diagnostics of electronic circuits and systems. Proceedings : 3rd DDECS Workshop. P. 52-58 / Gramatová Elena 1949- ; Fischerová Mária 1955- ; Manhaeve H. ; Pawlak A.. - Bratislava : Institute of Informatics SAS, 2000 Category AFC - Published papers from foreign scientific conferences Year 2000 article
Title Hierarchical Defect Level Test Quality Analysis Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Action User Forum Slovakia 2000. Moderné elektronické obvody a systémy - Zborník prednášok a posterov : 7.4. : Kongresové centrum SAV, zámok Smolenice Source document 2nd User Forum. P. 83-93. - Bratislava, 2000 Category AFC - Published papers from foreign scientific conferences Year 2000 article
Title ATPG for IDDQ and/or Voltage Testing of Combinational Circuits Using an Arbitrary Fault Library for Basic Gates Author Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gašpar Ján Mikloš P. Action ETW 2000 - IEEE European Test Workshop. Informal Digest : 23.-26.05. : Cascais, Portugalsko Issue data California, Los Alamitos : IEEE , 2000 Source document ETW 2000 - Informal Digest . P. 317-318 Category AFC - Published papers from foreign scientific conferences Year 2000 article