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Records found: 3  
Your query: Publisher = "IEEE Computer Society Test Technology Technical Council"
  1. TitleMBIST for LEON3 processor core cache
    Author Kincel Andrej SAVINFO - Ústav informatiky SAV
    Co-authors Baláž Marcel 1979- SAVINFO - Ústav informatiky SAV
    Source document / Sekanina Lukáš ; Fey Görschwin ; Růžička Richard ; Raik J. ; Aunet Snorre 2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems : DDECS. P. 287-288. - Brno : IEEE Computer Society Test Technology Technical Council, 2013 ; 2013 IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS
    CategoryADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2013
    DOI 10.1109/DDECS.2013.6549836
    article

    article

  2. Title2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems : DDECS
    Another authors Sekanina Lukáš
    Fey Görschwin
    Růžička Richard
    Raik J.
    Aunet Snorre
    Action2013 IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems. DDECS ( 16th : April 8-10, 2013 : Karlovy Vary )
    Issue dataBrno : IEEE Computer Society Test Technology Technical Council , 2013. - 300 p.
    CategoryFAI - Editorial work on book publications (bibliographies, encyclopedias, catalogues, dictionaries, collective publications/proceedings, atlases ...)
    References (1) Publication Activity of SAV - Articles
    book

    book



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