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Title Defect-oriented test generation and fault simulation in the environment of MOSCITO Author Schneider Andrea Co-authors Diener K.-H. Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Fischerová Mária 1955- SAVINFO - Ústav informatiky SAV Ivask E. Ubar R. Pleskacz W. Kuzmicz W. Source document BEC 2002 : Proceedings of the 8th Biennial Baltic Electronics Conference. (2002), S. 303-305. - Tallinn Category AEC - Scientific papers in foreign peer-reviewed proceedings, monographs Category of document (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Type of document príspevok Year 2002 
book
Title Internet-based collaborative test generation with MOSCITO Author Schneider Andrea Co-authors Ivask E. Mikloš P. Raik J. Diener K.-H. Ubar R. Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Action 2002 Design, Automation and Test in Europe Conference and Exhibition : March 4-8, 2002 : Paris, France Source document 2002 Design, Automation and Test in Europe Conference and Exhibition. Proceedings. P. 221-226. - Los Alamitos, California : The Institute of Electrical and Electronics Engineers, Inc., 2002 Category ADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus Year 2002 DOI 10.1109/DATE.2002.998273 
article