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Records found: 23  
Your query: Author Sysno = "^sav_un_auth 0157045^"
  1. TitleStudy and comparison of resist characteristics for different negative tone electron beam resist
    Author Andok Robert 1973- SAVINFO - Ústav informatiky SAV
    Co-authors Vutova Katia
    Benčurová Anna 1966- SAVINFO - Ústav informatiky SAV
    Kostič Ivan 1955- SAVINFO - Ústav informatiky SAV
    Koleva Elena
    Source document Journal of Physics: Conference Series. Vol. 2443, no. 1 (2023), art. no. 012006
    CategoryADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2023
    DOI 10.1088/1742-6596/2443/1/012006
    article

    article

  2. TitleOptimisation criteria for the process electron beam lithography of negative AR-N7520 resists
    Author Koleva Elena
    Co-authors Kostič Ivan 1955- SAVINFO - Ústav informatiky SAV
    Andok Robert 1973- SAVINFO - Ústav informatiky SAV
    Vutova Katia
    Benčurová Anna 1966- SAVINFO - Ústav informatiky SAV
    Konečníková Anna 1955- SAVINFO - Ústav informatiky SAV
    Source document Journal of Physics: Conference Series. Vol. 2443, no. 1 (2023), art. no. 012007
    CategoryADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2023
    DOI 10.1088/1742-6596/2443/1/012007
    article

    article

  3. TitleDependence of PMMA electron beam resist sidewall shape on exposure dose and resist thickness
    Author Andok Robert 1973- SAVINFO - Ústav informatiky SAV
    Co-authors Vutova Katia
    Koleva Elena
    Benčurová Anna 1966- SAVINFO - Ústav informatiky SAV
    Kostič Ivan 1955- SAVINFO - Ústav informatiky SAV
    Source document AIP Conference Proceedings : Applied Physics of Condensed Matter (APCOM 2021). Vol. 2411 (2021), art. no. 040001
    CategoryADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2021
    DOI 10.1063/5.0067068
    article

    article

  4. TitleOptimization of electron beam lithography processing of resist AR-N 7520
    Author Koleva Elena
    Co-authors Kostič Ivan 1955- SAVINFO - Ústav informatiky SAV
    Koleva Lilyana
    Vutova Katia
    Markova Irina
    Benčurová Anna 1966- SAVINFO - Ústav informatiky SAV
    Konečníková Anna 1955- SAVINFO - Ústav informatiky SAV
    Andok Robert 1973- SAVINFO - Ústav informatiky SAV
    Action VI International scientific conference INDUSTRY 4.0. Winter session : 8-11 December 2021 : Borovets, Bulgaria
    Source document Industry 4.0. Vol. 6, no. 5 (2021), p. 189-191
    CategoryADEB - Scientific papers in other foreign journals not registered in Current Contents Connect without IF (non-impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok z podujatia
    Year2022
    article

    article

  5. TitlePMMA resist profile and proximity effect dependence on the electron-beam lithography process parameters
    Author Kostič Ivan 1955- SAVINFO - Ústav informatiky SAV
    Co-authors Vutova Katia
    Koleva Elena
    Benčurová Anna 1966- SAVINFO - Ústav informatiky SAV
    Action VEIT 2019. 21st International Summer School on Vacuum, Electron and Ion Technologies : 23-27 September 2019 : Sozopol, Bulgaria
    Source document Journal of Physics: Conference Series. Vol. 1492 (2020), art. no. 012015
    CategoryADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2020
    DOI 10.1088/1742-6596/1492/1/012015
    article

    article

  6. TitleModeling approaches for electron beam lithography
    Author Koleva Elena
    Co-authors Vutova Katia
    Asparuhova Boriana
    Kostič Ivan 1955- SAVINFO - Ústav informatiky SAV
    Cvetkov K.
    Gerasimov V.
    Corporation EBT 2018. 13th International Conference on Electron Beam Technologies : Varna, Bulgaria : June 18-22, 2018
    Source document Journal of Physics: Conference Series. Vol. 1089 (2018), art. no. 012016
    CategoryADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2018
    DOI 10.1088/1742-6596/1089/1/012016
    URLURL link
    File nameAccessSizeDownloadedTypeLicense
    Modeling approaches for electron beam lithography.pdfavailable809.7 KB0Publisher's version
    article

    article

  7. TitleSimulation and experimental study on developed profiles in the positive polymer resist PMMA
    Author Koleva Elena
    Co-authors Vutova Katia
    Kostič Ivan 1955- SAVINFO - Ústav informatiky SAV
    Corporation EBT 2018. 13th International Conference on Electron Beam Technologies : Varna, Bulgaria : June 18-22, 2018
    Source document Journal of Physics: Conference Series. Vol. 1089 (2018), art. no. 012015
    CategoryADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2018
    DOI 10.1088/1742-6596/1089/1/012015
    URLURL link
    article

    article

  8. TitleElectron beam energy deposition and resist profile modeling during electron beam lithography process
    Author Cvetkov Kristian
    Co-authors Gerasimov Vladislav
    Kostič Ivan 1955- SAVINFO - Ústav informatiky SAV
    Koleva Elena
    Vutova Katia
    Asparuhova Boriana
    ActionInternational scientific conference High technologies. business. society. HTBS 2018 : 12.-15.3.2018 : Borovets, Bulgaria
    Source document International scientific conference High technologies. business. Society : Proceedings, Volume I "High technologies". Vol. II, no. 1 (2018), p. 124-127. - Sofia, Bulgaria : Scientific Technical Union of Mechanical Engineering Industry 4.0
    CategoryAFC - Published papers from foreign scientific conferences
    Year2018
    article

    article

  9. TitleElectron beam lithography method for high-resolution nanofabrication
    Author Kostič Ivan 1955- SAVINFO - Ústav informatiky SAV
    Co-authors Vutova Katia
    Benčurová Anna 1966- SAVINFO - Ústav informatiky SAV
    Nemec Pavol 1975- SAVINFO - Ústav informatiky SAV
    Koleva Elena
    ActionInternational scientific conference High technologies. business. society. HTBS 2017 : 13.-16.3.2017 : Borovets, Bulgaria
    Source document International scientific conference High technologies. business. Society : Proceedings, Volume I "High technologies". Vol. I, no. 1 (2017), p. 9-12. - Sofia, Bulgaria : Scientific Technical Union of Mechanical Engineering Industry 4.0
    CategoryAFC - Published papers from foreign scientific conferences
    Year2017
    URLURL link
    File nameAccessSizeDownloadedTypeLicense
    Electron beam lithography method for high-resolution nanofabrication.pdfNeprístupný/archív415.1 KB1Publisher's version
    article

    article

  10. TitleStudy of the new CSAR62 positive tone electron-beam resist at 40 keV electron energy
    Author Andok Robert 1973- SAVINFO - Ústav informatiky SAV
    Co-authors Benčurová Anna 1966- SAVINFO - Ústav informatiky SAV
    Vutova Katia
    Koleva Elena
    Nemec Pavel SAVINFO - Ústav informatiky SAV
    Hrkút Pavol 1948- SAVINFO - Ústav informatiky SAV
    Kostič Ivan 1955- SAVINFO - Ústav informatiky SAV
    Mladenov Georgy
    Source document Journal of Physics: Conference Series. Vol. 700 (2016), art. no. 012030
    CategoryADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2016
    DOI 10.1088/1742-6596/700/1/012030
    File nameAccessSizeDownloadedTypeLicense
    Study of the new CSAR62 positive tone electron-beam resist at 40 keV electron energy.pdfavailable1.8 MB4Publisher's version
    article

    article


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