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Title Reliability Issues in GaN electronic devices Author Ťapajna Milan 1977 SAVELEK - Elektrotechnický ústav SAV Co-authors Koller C. Source document Nitride semiconductor technology : power electronics and optoelectronic devices. P. 199-253. - Weinheim : Wiley-VCH, 2020 / Roccaforte F. ; Leszczynski M. Category ABC - Chapters in scientific monographs published abroad Category of document (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Type of document kapitola Year 2020 File name Access Size Downloaded Type License Reliability Issues_FrontMatter.pdf available 129.3 KB 6 Publisher's version Reliability Issues in GaN Electronic Devices.pdf Neprístupný/archív 3.2 MB 3 Postprint 
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