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Records found: 215  
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  1. TitleLocal increase in compressive strain (GaN) in gate recessed AlGaN/GaN MISHFET structures induced by an amorphous AlN dielectric layer
    Author Mikulics M.
    Co-authors Kordoš Peter SAVELEK - Elektrotechnický ústav SAV
    Gregušová Dagmar 1958 SAVELEK - Elektrotechnický ústav SAV
    Gaži Štefan 1948 SAVELEK - Elektrotechnický ústav SAV
    Novák Jozef 1951 SAVELEK - Elektrotechnický ústav SAV
    Sofer Z.
    Mayer J.
    Hartdegen H.
    Source document Semiconductor Science and Technology. Vol. 36 (2021), no. 095040
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2021
    DOI 10.1088/1361-6641/ac1a28
    article

    article

  2. TitleConditioning nano-LEDs in arrays by laser-micro-annealing: the key to their performance improvement
    Author Mikulics M.
    Co-authors Kordoš Peter SAVELEK - Elektrotechnický ústav SAV
    Gregušová Dagmar 1958 SAVELEK - Elektrotechnický ústav SAV
    Sofer Z.
    Winden A.
    Trellenkamp St.
    Moers J.
    Mayer J.
    Hardtdegen H.
    Source document Applied Physics Letters. Vol. 118 (2021), no. 04310
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2021
    DOI 10.1063/5.0038070
    File nameAccessSizeDownloadedTypeLicense
    Conditioning nano-LEDs in arrays by laser-micro-annealing.pdfNeprístupný/archív1.8 MB4Publisher's version
    article

    article

  3. TitleInfluence of oxygen-plasma treatment on AlGaN/GaN metal-oxide-semiconductor heterostructure field-effect transistors with HfO2 by atomic layer deposition: leakage current and density of states reduction
    Author Stoklas Roman 1981 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Gregušová Dagmar 1958 SAVELEK - Elektrotechnický ústav SAV
    Blaho Michal 1983 SAVELEK - Elektrotechnický ústav SAV
    Fröhlich Karol 1954 SAVELEK - Elektrotechnický ústav SAV
    Novák Jozef 1951 SAVELEK - Elektrotechnický ústav SAV
    Matys M.
    Yatabe Z.
    Kordoš Peter
    Hashizume T.
    Source document Semiconductor Science and Technology. Vol. 32 (2017), no. 045018
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2017
    DOI 10.1088/1361-6641/aa5fcb
    File nameAccessSizeDownloadedTypeLicense
    Influence of oxygen-plasma treatment on AlGaNGaN metal-oxide-semiconductor heterostructure field-effect transistors with HfO2.pdfNeprístupný/archív1.5 MB1Publisher's version
    article

    article

  4. TitleProperties of InGaAs/GaAs metal-oxide-semiconductor heterostructure field-effect transistors modified by surface treatment
    Author Gregušová Dagmar 1958 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Gucmann Filip 1987 SAVELEK - Elektrotechnický ústav SAV
    Kúdela Róbert 1952 SAVELEK - Elektrotechnický ústav SAV
    Mičušík Matej 1977- SAVPOLYM - Ústav polymérov SAV
    Stoklas Roman 1981 SAVELEK - Elektrotechnický ústav SAV
    Válik Lukáš 1990 SAVELEK - Elektrotechnický ústav SAV
    Greguš J.
    Blaho Michal 1983 SAVELEK - Elektrotechnický ústav SAV
    Kordoš Peter
    Source document Applied Surface Science. Vol. 395 (2017), p. 140-144
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2017
    DOI 10.1016/j.apsusc.2016.07.019
    article

    article

  5. TitleTemperature-induced instability of the threshold voltage in GaN-based heterostructure field-effect transistors
    Author Florovič M.
    Co-authors Stoklas Roman 1981 SAVELEK - Elektrotechnický ústav SAV
    Kováč Jaroslav
    Kordoš Peter
    Source document Semiconductor Science and Technology. Vol. 32 (2017), art. no. 025017
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2017
    DOI 10.1088/1361-6641/aa5253
    File nameAccessSizeDownloadedTypeLicense
    Temperature-induced instability of the threshold voltage in GaN-based heterostructure field-effect transistors.pdfNeprístupný/archív915.3 KB1Publisher's version
    article

    article

  6. TitleDirect electro-optical pumping for hybrid CdSe nanocrystal/III-nitride based nano-light-emitting diodes
    Author Mikulics M.
    Co-authors Arango Y.C.
    Winden A.
    Adam Roman
    Hardtdegen A.
    Grützmacher D.
    Plinski E.
    Gregušová Dagmar 1958 SAVELEK - Elektrotechnický ústav SAV
    Novák Jozef 1951 SAVELEK - Elektrotechnický ústav SAV
    Kordoš Peter
    Moonshiram A.
    Marso M.
    Sofer Z.
    Luth H.
    Hardtdegen H.
    Source document Applied Physics Letters. Vol. 108 (2016), art. no. 061107
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2016
    DOI 10.1063/1.4941923
    File nameAccessSizeDownloadedTypeLicense
    Direct electro optical pumping for hybrid CdSe nanocrystal.pdfNeprístupný/archív3 MB0Publisher's version
    article

    article

  7. TitleTrap analysis in GaN-based heterostructures using current transients measurements
    Author Florovič M.
    Co-authors Škriniarová Jaroslava
    Gregušová Dagmar 1958 SAVELEK - Elektrotechnický ústav SAV
    Kováč Jaroslav
    Kordoš Peter
    Source document ASDAM 2016 : the 11th International Conference on Advanced Semiconductor Devices and Microsystems. P. 185-188. - : IEEE, 2016 / Haščík Štefan 1956 ; Dzuba Jaroslav 1987 ; Vanko Gabriel 1981
    CategoryADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2016
    DOI 10.1109/ASDAM.2016.7805926
    article

    article

  8. TitleIII-As heterostructure field-effect transistors with recessed ex-situ gate oxide by O2 plasma-oxidized GaAs cap
    Author Gucmann Filip 1987 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Kúdela Róbert 1952 SAVELEK - Elektrotechnický ústav SAV
    Kordoš Peter SAVELEK - Elektrotechnický ústav SAV
    Dobročka Edmund 1955 SAVELEK - Elektrotechnický ústav SAV
    Gaži Štefan 1948 SAVELEK - Elektrotechnický ústav SAV
    Dérer Ján 1948 SAVELEK - Elektrotechnický ústav SAV
    Liday J.
    Vogrinčič P.
    Gregušová Dagmar 1958 SAVELEK - Elektrotechnický ústav SAV
    Source document Journal of Vacuum Science and Technology B. Vol. 33, (2015), 01A111, Microelectronics and Nanometer Structures
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2015
    DOI 10.1116/1.4905938
    article

    article

  9. TitleLow- and high-frequency capacitance of aluminum gallium nitride/gallium nitride heterostructures with interface traps
    Author Osvald Jozef 1953 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Stoklas Roman 1981 SAVELEK - Elektrotechnický ústav SAV
    Kordoš Peter SAVELEK - Elektrotechnický ústav SAV
    Source document Materials science in semiconductor processing. Vol. 31, (2015), p. 525-529
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2015
    DOI 10.1016/j.mssp.2014.11.052
    article

    article

  10. TitleExtraction of interface trap density of Al2O3/AlGaN/GaN MIS heterostructure capacitance
    Author Osvald Jozef 1953 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Stoklas Roman 1981 SAVELEK - Elektrotechnický ústav SAV
    Kordoš Peter SAVELEK - Elektrotechnický ústav SAV
    Source document Physica status solidi B. Basic solid state physics. Vol. 252 (2015), p. 996-1000
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2015
    DOI 10.1002/pssb.201451468
    article

    article


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