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Title Proceedings of the 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS Another authors Pleskacz W. Renovell M. Kasprowicz Dominik Sekanina Lukáš Bernard Serge Issue data Piscataway : IEEE , 2014. - 323 p. References (3) Publication Activity of SAV - Articles 
book
Title Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS Another authors Raik J. Stopjaková V. Jenihhin Maksim Vierhaus Heinrich T. Pleskacz W. Ubar Raimund Action 2012 IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems. DDECS 2012 ( 15th : April 18-20, 2012 : Tallinn ) Issue data Piscataway : IEEE , 2012. - 386 p. Category FAI - Editorial work on book publications (bibliographies, encyclopedias, catalogues, dictionaries, collective publications/proceedings, atlases ...) References (1) Publication Activity of SAV - Articles book
Title Various MDCT implementations in 0.34 μm CMOS Author Malík Peter 1980 - SAVINFO - Ústav informatiky SAV Co-authors Baláž Marcel 1979- SAVINFO - Ústav informatiky SAV Šimlaštík Martin SAVINFO - Ústav informatiky SAV Luczyk Arkadiusz Pleskacz W. Source document / Straube B. ; Drutarovský M. ; Renovell M. ; Gramata P. ; Fischerová Mária 1955- 2008 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : proceedings. P. 170-173. - Bratislava : The Institute of Electrical and Electronic Engineers, 2008 ; IEEE Design and Daignostics of Electronic Circuits and Systems Workshop IEEE DDECS Workshop Category AEC - Scientific papers in foreign peer-reviewed proceedings, monographs Category of document (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Type of document príspevok Year 2008 
article
Title Defects, faults, fault models : chapter 2 Author Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Co-authors Ubar Raimund Pleskacz W. Fischerová Mária 1955- SAVINFO - Ústav informatiky SAV Source document / Novák Ondřej ; Gramatová Elena 1949- ; Ubar Raimund Handbook of testing electronic systems. s. 26-96. - Praha : České vysoké učení technické v Praze, 2005 Category ABC - Chapters in scientific monographs published abroad Category of document (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Type of document kapitola Year 2005 book
Title Hierarchical test generation for combinational circuits with real defects coverage Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Fischerová Mária 1955- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Pleskacz W. Raik J. Ubar R. Source document Microelectronics reliability. No. 42 (2002), s. 1141-1149 Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Year 2002 DOI 10.1016/S0026-2714(02)00080-X article
Title Defect-oriented test generation and fault simulation in the environment of MOSCITO Author Schneider Andrea Co-authors Diener K.-H. Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Fischerová Mária 1955- SAVINFO - Ústav informatiky SAV Ivask E. Ubar R. Pleskacz W. Kuzmicz W. Source document BEC 2002 : Proceedings of the 8th Biennial Baltic Electronics Conference. (2002), S. 303-305. - Tallinn Category AEC - Scientific papers in foreign peer-reviewed proceedings, monographs Category of document (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Type of document príspevok Year 2002 book
Title Defect-oriented library builder and hierarchical test generation Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Pleskacz W. Raik J. Ubar R. Action 4th International Workshop on IEEE DDECS 2001 ( 4th : April 18-20, 2001 : Györ, Hungary ) Source document Proceedings of IEEE Design and Diagnostics of electronic circuits and systems Workshop 2001. P. 163-168. - Hungary : SZIF-UNIVERSITAS Ltd., 2001 Category AFC - Published papers from foreign scientific conferences Year 2001 article
Title Defect-oriented test pattern generation for circuits with complex gates Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Mikloš P. Pleskacz W. Action 3rd Electronic Circuits and Systems Conference 2001 ( 3rd : September 5-7, 2001 : Bratislava ) Source document ECS'01.Conference Proceedings : 3rd Electronic Circuits and Systems Conference. P. 3-6. - Bratislava, 2001 Category AFD - Published papers from domestic scientific conferences Year 2001 article
Title Defect-oriented test generation using probabilistic estimation Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Fischerová Mária 1955- Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Pleskacz W. Raik J. Ubar R. Action 8th International Conference MIXDES 2001 ( 8th : June 21-23, 2001 : Zakopane, Poland ) Source document Proceedings of the 8th International Conference MIXDES 2001 : Mixed Design of Integrated Circuits and Systems. P. 131-136. - Poland : Andrzej Napieralski, 2001 Category AFC - Published papers from foreign scientific conferences Year 2001 article
Title Hierarchical defect-oriented fault simulation for digital circuits Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Source document ETW 2000 - Informal Digest : IEEE European Test Workshop. P. 151-156 / Prinetto P. ; Teixiera J.P. ; Teixiera I.M.C. ; Flottes M.L.. - Los Alamitos : IEEE, 2000 Category AFC - Published papers from foreign scientific conferences Year 2000 article