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Title 2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems : DDECS Another authors Sekanina Lukáš Fey Görschwin Růžička Richard Raik J. Aunet Snorre Action 2013 IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems. DDECS ( 16th : April 8-10, 2013 : Karlovy Vary ) Issue data Brno : IEEE Computer Society Test Technology Technical Council , 2013. - 300 p. Category FAI - Editorial work on book publications (bibliographies, encyclopedias, catalogues, dictionaries, collective publications/proceedings, atlases ...) References (1) Publication Activity of SAV - Articles 
book
Title Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS Another authors Raik J. Stopjaková V. Jenihhin Maksim Vierhaus Heinrich T. Pleskacz W. Ubar Raimund Action 2012 IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems. DDECS 2012 ( 15th : April 18-20, 2012 : Tallinn ) Issue data Piscataway : IEEE , 2012. - 386 p. Category FAI - Editorial work on book publications (bibliographies, encyclopedias, catalogues, dictionaries, collective publications/proceedings, atlases ...) References (1) Publication Activity of SAV - Articles book
Title Design and test technology for dependable systems-on-chip Author Ubar Raimund Co-authors Raik J. Vierhaus Heinrich T. Issue data New York : Information Science Reference , 2011. - ebook Category AAA - Scientific monographs published abroad References (2) Publication Activity of SAV - Articles book
Title Hierarchical test generation for combinational circuits with real defects coverage Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Fischerová Mária 1955- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Pleskacz W. Raik J. Ubar R. Source document Microelectronics reliability. No. 42 (2002), s. 1141-1149 Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Year 2002 DOI 10.1016/S0026-2714(02)00080-X 
article
Title Internet-based collaborative test generation with MOSCITO Author Schneider Andrea Co-authors Ivask E. Mikloš P. Raik J. Diener K.-H. Ubar R. Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Action 2002 Design, Automation and Test in Europe Conference and Exhibition : March 4-8, 2002 : Paris, France Source document 2002 Design, Automation and Test in Europe Conference and Exhibition. Proceedings. P. 221-226. - Los Alamitos, California : The Institute of Electrical and Electronics Engineers, Inc., 2002 Category ADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus Year 2002 DOI 10.1109/DATE.2002.998273 article
Title Defect-oriented library builder and hierarchical test generation Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Pleskacz W. Raik J. Ubar R. Action 4th International Workshop on IEEE DDECS 2001 ( 4th : April 18-20, 2001 : Györ, Hungary ) Source document Proceedings of IEEE Design and Diagnostics of electronic circuits and systems Workshop 2001. P. 163-168. - Hungary : SZIF-UNIVERSITAS Ltd., 2001 Category AFC - Published papers from foreign scientific conferences Year 2001 article
Title Defect-oriented test generation using probabilistic estimation Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Fischerová Mária 1955- Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Pleskacz W. Raik J. Ubar R. Action 8th International Conference MIXDES 2001 ( 8th : June 21-23, 2001 : Zakopane, Poland ) Source document Proceedings of the 8th International Conference MIXDES 2001 : Mixed Design of Integrated Circuits and Systems. P. 131-136. - Poland : Andrzej Napieralski, 2001 Category AFC - Published papers from foreign scientific conferences Year 2001 article
Title Hierarchical defect-oriented fault simulation for digital circuits Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Source document ETW 2000 - Informal Digest : IEEE European Test Workshop. P. 151-156 / Prinetto P. ; Teixiera J.P. ; Teixiera I.M.C. ; Flottes M.L.. - Los Alamitos : IEEE, 2000 Category AFC - Published papers from foreign scientific conferences Year 2000 article
Title Hierarchical defect-oriented fault simulation for digital circuits Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Source document IEEE European Test Workshop. Order No. PROO390 (2000), p. 69-74. - Los Alamitos, California : IEEE Computer Society Category ADC Year 2000 article
Title Hierarchical Defect Level Test Quality Analysis Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Action User Forum Slovakia 2000. Moderné elektronické obvody a systémy - Zborník prednášok a posterov : 7.4. : Kongresové centrum SAV, zámok Smolenice Source document 2nd User Forum. P. 83-93. - Bratislava, 2000 Category AFC - Published papers from foreign scientific conferences Year 2000 article