Search results

Records found: 35  
Your query: Author Sysno = "^sav_un_auth 0103625^"
  1. TitleSpectrometry of electron irradiated CdTe Schottky-barrier semiconductor detectors before polarization onset
    Author Sedlačková K.
    Co-authors Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV
    Nečas V.
    Action APVV 18-0273. vedúci projektu Zaťko, Bohumír : 2019-2023
    APVV 18-0243. vedúci projektu Zaťko, Bohumír : 2019-2022
    VEGA 2/0084/20. vedúci projektu Zaťko, Bohumír : 2020-2023
    Source document AIP Conference Proceedings : Applied Physics of Condensed Matter (APCOM 2022), 22–24 June 2022, Štrbské Pleso, Slovak Republic. Vol. 2778 (2023), no. 060010
    CategoryADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok z podujatia
    Year2023
    DOI 10.1063/5.0136307
    File nameAccessSizeDownloadedTypeLicense
    Spectrometry of electron irradiated cdTe Schottky-barrier semiconductor detectors before polarization onset.pdfNeprístupný/archív1.1 MB0Publisher's version
    article

    article

  2. TitlePolarization effect of Schottky-barrier CdTe semiconductor detectors after electron irradiation
    Author Sedlačková K.
    Co-authors Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV
    Šagátová A.
    Nečas V.
    Source document Nuclear Instruments and Methods in Physics Research A. Accelerators, Spectrometers, Detectors and Associated Equipment. Vol. 1027 (2022), no. 166282
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2022
    DOI 10.1016/j.nima.2021.166282
    File nameAccessSizeDownloadedTypeLicense
    Polarization effect of Schottky barrier CdTe semiconductor.pdfNeprístupný/archív1.2 MB2Publisher's version
    article

    article

  3. TitleHigh-energy electron irradiation of semiconductor detectors and radiation hardness comparison
    Author Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Šagátová A.
    Sedlačková K.
    Hrubčín Ladislav 1951 SAVELEK - Elektrotechnický ústav SAV
    Boháček Pavol 1954 SAVELEK - Elektrotechnický ústav SAV
    Source document Progress in applied surface, interface and thin film science – solar renewable energy news 2021. SURFINT – SREN VII : extended abstract book. P. 77-78. - Bratislava : Comenius Univ., 2021 / Brunner Róbert 1954
    CategoryAFH - Abstracts of papers from domestic conferences
    Year2021
    article

    article

  4. TitleEffects of electron irradiation on spectrometric properties of Schottky barrier CdTe radiation detectors
    Author Sedlačková K.
    Co-authors Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV
    Pavlovič M.
    Šagátová A.
    Nečas V.
    Action APVV 18-0273. vedúci projektu Zaťko, Bohumír : 2019-2023
    APVV 18-0243. vedúci projektu Zaťko, Bohumír : 2019-2022
    Source document International Journal of Modern Physics: Conference Series : Applications of Nuclear Techniques (CRETE19). Vol. 50 (2020), no. 2060017
    CategoryADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2020
    DOI 10.1142/S2010194520600174
    File nameAccessSizeDownloadedTypeLicense
    Effects of electron irradiation on spectrometric properties.pdfavailable584.8 KB1Publisher's version
    article

    article

  5. TitleThe study of 4H-SiC alpha particle detectors with different Schottky contact metallization
    Author Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Dubecký František 1946 SAVELEK - Elektrotechnický ústav SAV
    Ryc L.
    Šagátová A.
    Sedlačková K.
    Kováčová Eva 1966 SAVELEK - Elektrotechnický ústav SAV
    Nečas V.
    Source document AIP Conference Proceedings : Applied Physics of Condensed Matter (APCOM 2018). Vol. 1996 (2018), no. 020051
    CategoryADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2018
    DOI 10.1063/1.5048903
    article

    article

  6. TitleComparison of semi-insulating GaAs and 4H-SiC-based semiconductor detector covered by LiF film for thermal neutron detection
    Author Sedlačková K.
    Co-authors Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV
    Šagátová A.
    Nečas V.
    Boháček Pavol 1954 SAVELEK - Elektrotechnický ústav SAV
    Sekáčová Mária 1955 SAVELEK - Elektrotechnický ústav SAV
    Source document Applied Surface Science. Vol. 461 (2018), p. 242-248
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2018
    DOI 10.1016/j.apsusc.2018.05.121
    article

    article

  7. TitleNeutron detection using epitaxial 4H-SiC detector structures
    Author Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Šagátová A.
    Sedlačková K.
    Boháček Pavol 1954 SAVELEK - Elektrotechnický ústav SAV
    Sekáčová Mária 1955 SAVELEK - Elektrotechnický ústav SAV
    Kováčová Eva 1966 SAVELEK - Elektrotechnický ústav SAV
    Nečas V.
    Action VEGA 2/0092/18. vedúci projektu Zápražný, Zdenko : 2018-2020
    Source document ASDAM 2018 : The Twelfth International Conference on Advanced Semiconductor Devices and Microsystems. P. 39-42. - : IEEE, 2018 / Breza J. ; Donoval D. ; Vavrinský E. ; ASDAM 2018 The Twelfth International Conference on Advanced Semiconductor Devices and Microsystems
    CategoryAFD - Published papers from domestic scientific conferences
    Year2018
    DOI 10.1109/ASDAM.2018.8544539
    article

    article

  8. TitleSchottky barrier detectors based on high quality 4H-SIC semiconductor: electrical and detection properties
    Author Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Hrubčín Ladislav 1951 SAVELEK - Elektrotechnický ústav SAV
    Šagátová A.
    Osvald Jozef 1953 SAVELEK - Elektrotechnický ústav SAV
    Boháček Pavol 1954 SAVELEK - Elektrotechnický ústav SAV
    Zápražný Zdenko 1980 SAVELEK - Elektrotechnický ústav SAV
    Sedlačková K.
    Sekáčová Mária 1955 SAVELEK - Elektrotechnický ústav SAV
    Dubecký František 1946 SAVELEK - Elektrotechnický ústav SAV
    Skuratov V.A.
    Korytár Dušan 1950 SAVELEK - Elektrotechnický ústav SAV
    Nečas V.
    Source document Applied Surface Science. Vol. 461 (2018), p. 276-280
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2018
    DOI 10.1016/j.apsusc.2018.07.008
    article

    article

  9. TitleFrom single GaAs detector to sensor for radiation imaging camera
    Author Šagátová A.
    Co-authors Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV
    Nečas V.
    Dubecký František 1946 SAVELEK - Elektrotechnický ústav SAV
    Ly Anh T.
    Sedlačková K.
    Boháček Pavol 1954 SAVELEK - Elektrotechnický ústav SAV
    Zápražný Zdenko 1980 SAVELEK - Elektrotechnický ústav SAV
    Source document Applied Surface Science. Vol. 461 (2018), p. 3-9
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2018
    DOI 10.1016/j.apsusc.2018.06.269
    article

    article

  10. TitleCharacteristics of Si and SiC detectors at registration of Xe ions
    Author Hrubčín Ladislav 1951 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Gurov J.B.
    Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV
    Mitrofanov S.V.
    Rozov S.V.
    Sedlačková K.
    Sandukovsky V.G.
    Semin V.A.
    Nečas V.
    Skuratov V.A.
    Source document Journal of Instrumentation. Vol. 13 (2018), no. P11005
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2018
    DOI 10.1088/1748-0221/13/11/P11005
    URLURL link
    File nameAccessSizeDownloadedTypeLicense
    Characteristics of Si and SiC detectors at registration of Xe ions.pdfNeprístupný/archív1.2 MB1Publisher's version
    article

    article


  This site uses cookies to make them easier to browse. Learn more about how we use cookies.