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Title Hierarchical test generation for combinational circuits with real defects coverage Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Fischerová Mária 1955- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Pleskacz W. Raik J. Ubar R. Source document Microelectronics reliability. No. 42 (2002), s. 1141-1149 Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Year 2002 DOI 10.1016/S0026-2714(02)00080-X 
article
Title Defect-oriented test generation and fault simulation in the environment of MOSCITO Author Schneider Andrea Co-authors Diener K.-H. Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Fischerová Mária 1955- SAVINFO - Ústav informatiky SAV Ivask E. Ubar R. Pleskacz W. Kuzmicz W. Source document BEC 2002 : Proceedings of the 8th Biennial Baltic Electronics Conference. (2002), S. 303-305. - Tallinn Category AEC - Scientific papers in foreign peer-reviewed proceedings, monographs Category of document (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Type of document príspevok Year 2002 
book
Title Internet-based collaborative test generation with MOSCITO Author Schneider Andrea Co-authors Ivask E. Mikloš P. Raik J. Diener K.-H. Ubar R. Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Action 2002 Design, Automation and Test in Europe Conference and Exhibition : March 4-8, 2002 : Paris, France Source document 2002 Design, Automation and Test in Europe Conference and Exhibition. Proceedings. P. 221-226. - Los Alamitos, California : The Institute of Electrical and Electronics Engineers, Inc., 2002 Category ADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus Year 2002 DOI 10.1109/DATE.2002.998273 article
Title Defect-oriented library builder and hierarchical test generation Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Pleskacz W. Raik J. Ubar R. Action 4th International Workshop on IEEE DDECS 2001 ( 4th : April 18-20, 2001 : Györ, Hungary ) Source document Proceedings of IEEE Design and Diagnostics of electronic circuits and systems Workshop 2001. P. 163-168. - Hungary : SZIF-UNIVERSITAS Ltd., 2001 Category AFC - Published papers from foreign scientific conferences Year 2001 article
Title Defect-oriented test generation using probabilistic estimation Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Fischerová Mária 1955- Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Pleskacz W. Raik J. Ubar R. Action 8th International Conference MIXDES 2001 ( 8th : June 21-23, 2001 : Zakopane, Poland ) Source document Proceedings of the 8th International Conference MIXDES 2001 : Mixed Design of Integrated Circuits and Systems. P. 131-136. - Poland : Andrzej Napieralski, 2001 Category AFC - Published papers from foreign scientific conferences Year 2001 article
Title Hierarchical defect-oriented fault simulation for digital circuits Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Source document ETW 2000 - Informal Digest : IEEE European Test Workshop. P. 151-156 / Prinetto P. ; Teixiera J.P. ; Teixiera I.M.C. ; Flottes M.L.. - Los Alamitos : IEEE, 2000 Category AFC - Published papers from foreign scientific conferences Year 2000 article
Title Hierarchical defect-oriented fault simulation for digital circuits Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Source document IEEE European Test Workshop. Order No. PROO390 (2000), p. 69-74. - Los Alamitos, California : IEEE Computer Society Category ADC Year 2000 article
Title Hierarchical Defect Level Test Quality Analysis Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Action User Forum Slovakia 2000. Moderné elektronické obvody a systémy - Zborník prednášok a posterov : 7.4. : Kongresové centrum SAV, zámok Smolenice Source document 2nd User Forum. P. 83-93. - Bratislava, 2000 Category AFC - Published papers from foreign scientific conferences Year 2000 article
Title Virtual laboratory for research in dependable microelectronics Author Diener K.-H. Co-authors Elst G. Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Peng Z. Ubar R. Action BEC 2000 - Baltic electronics Conference. The 7th Biennial Conference on Electronics and Microsystem Technology : 8.-11.10 : Tallinn, Estonia Source document BEC 2000 Baltic Electronics Conference : Conference Proceedings. P. 217-220. - Tallin, Estonia : Tallinn Technical University, 2000 Category AFC - Published papers from foreign scientific conferences Year 2000 article
Title Defect oriented fault coverage of 100% stuck-at fault test set Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Action Mixdes 2000 - Mixed design of integrated circuits and systems. Proceedings of the 7th International Conference : 15.-17.06. : Gdynia, Poland Source document Mixed design of integrated circuits and systems. P. 511-516 Category AFC - Published papers from foreign scientific conferences Year 2000 article