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Title Internet-based collaborative test generation with MOSCITO Author Schneider Andrea Co-authors Ivask E. Mikloš P. Raik J. Diener K.-H. Ubar R. Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Action 2002 Design, Automation and Test in Europe Conference and Exhibition : March 4-8, 2002 : Paris, France Source document 2002 Design, Automation and Test in Europe Conference and Exhibition. Proceedings. P. 221-226. - Los Alamitos, California : The Institute of Electrical and Electronics Engineers, Inc., 2002 Category ADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus Year 2002 DOI 10.1109/DATE.2002.998273 
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Title A new open platform for VHDL modelling on behavioural level Author Štefanovič J. Co-authors Mikloš P. Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Action 4th International Workshop on IEEE DDECS 2001 ( 4th : April 18-20, 2001 : Györ, Hungary ) Source document Proceedings of IEEE Design and Diagnostics of electronic circuits and systems Workshop 2001. P. 141-144. - Hungary : SZIF-UNIVERSITAS Ltd., 2001 Category AFC - Published papers from foreign scientific conferences Year 2001 article
Title Test pattern generation using a new VHDL open platform on behavioral level Author Štefanovič J. Co-authors Mikloš P. Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Fischerová Mária 1955- SAVINFO - Ústav informatiky SAV Action Informal Digest of IEEE ETW 2001 : May 29-June 1, 2001 : Stockholm, Sweden Source document Informal Digest of IEEE European Test Workshop 2001. P. 211-213. - Stockholm, Sweden, 2001 Category AFC - Published papers from foreign scientific conferences Year 2001 article
Title Fault simulation at the behavioural level using a new VHDL open platform Author Štefanovič J. Co-authors Mikloš P. Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Fischerová Mária 1955- SAVINFO - Ústav informatiky SAV Action 3rd Electronic Circuits and Systems Conference 2001 ( 3rd : September 5-7, 2001 : Bratislava ) Source document ECS'01.Conference Proceedings : 3rd Electronic Circuits and Systems Conference. P. 7-10. - Bratislava, 2001 Category AFD - Published papers from domestic scientific conferences Year 2001 article
Názov Defect-oriented test pattern generation for circuits with complex gates Autor Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Spoluautori Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Mikloš P. Pleskacz W. Akcia 3rd Electronic Circuits and Systems Conference 2001 ( 3rd : September 5-7, 2001 : Bratislava ) Zdroj.dok. ECS'01.Conference Proceedings : 3rd Electronic Circuits and Systems Conference. P. 3-6. - Bratislava, 2001 Kategória AFD - Publikované príspevky na domácich vedeckých konferenciách Rok vykazovania 2001 article
Názov ATPG for IDDQ and/or Voltage Testing of Combinational Circuits Using an Arbitrary Fault Library for Basic Gates Autor Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Spoluautori Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gašpar Ján Mikloš P. Akcia ETW 2000 - IEEE European Test Workshop. Informal Digest : 23.-26.05. : Cascais, Portugalsko Vyd.údaje California, Los Alamitos : IEEE , 2000 Zdroj.dok. ETW 2000 - Informal Digest . P. 317-318 Kategória AFC - Publikované príspevky na zahraničných vedeckých konferenciách Rok vykazovania 2000 article